SAR image sample generation method based on sketch and structure generation countermeasure network

A technology of image samples and sketch maps, applied in biological neural network models, neural architectures, instruments, etc., can solve the problems that SAR images cannot be classified and segmented, and samples are unbalanced.

Active Publication Date: 2019-01-11
XIDIAN UNIV
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Problems solved by technology

[0007] The purpose of the present invention is to provide a SAR image sample generation method based on sketch and structure generation confrontation network, which solves the existing sample imbalance, which leads to the defect that the SAR image cannot be classified and segmented

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  • SAR image sample generation method based on sketch and structure generation countermeasure network
  • SAR image sample generation method based on sketch and structure generation countermeasure network
  • SAR image sample generation method based on sketch and structure generation countermeasure network

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Embodiment Construction

[0067] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0068] Such as figure 1 As shown, a kind of SAR image sample generation method based on sketch and structure generation confrontation network provided by the present invention comprises the following steps:

[0069] Step 1: Sketch the input original SAR image I to obtain the sketch image I of the input SAR image s ,specifically:

[0070] According to the distribution characteristics of the input original SAR image I, its sketch model is obtained, and the sketch model is used to perform sketch processing on the input original SAR image, and the sketch image I of the input SAR image is obtained s ;Sketch Figure I s It is a binarized image, where the value of the part that can be sketched is 1, indicating that the brightness of the original SAR image I changes suddenly, and the value of the part that cannot be sketched is 0, indicating that the brightness of ...

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Abstract

The invention provides a SAR image sample generation method based on a sketch and structure generation antagonistic network, which mainly solves the problem of sample imbalance in the semantic segmentation of the SAR image. The method comprises the following steps of: (1) sketching a SAR image to obtain a sketch map; (2) according to the region map of SAR image, extracting the small extremely heterogeneous region; (3) constructing a paired data set of sketch blocks-SAR image blocks; (4) selecting the samples from the data set to compose the training set and the test set; (5) constructing a generating antagonistic network based on sketch information and structural constraints; (6) training the sketch fitting network, the discrimination network and the generation network alternately by sketch line loss, antagonistic loss and generator loss,; (7), inputting a test sketch block to the trained generation network to obtain a generated SAR image block. The invention can generate SAR image samples coinciding with the original SAR image ground object structure according to the sketch map, and can solve the sample unbalance problem of extremely uneven region classification of the SAR image.

Description

technical field [0001] The invention belongs to the technical field of image generation, and further relates to deep learning, an image generation method for generating confrontation network GANs (Generative Adversarial Networks) and synthetic aperture radar SAR (Synthetic ApertureRadar) images. Background technique [0002] Sample imbalance is a common and unavoidable problem in SAR image classification and segmentation. Commonly used machine learning models usually assume that the samples are unbiased samples of the real distribution. However, in image classification, due to the disparity between rare and rich samples, most models have extremely poor recall rates for rare categories on the test set. Similarly, the existence of small areas puts forward higher requirements on the segmentation technology of SAR images. If image segmentation is regarded as a classification problem at the image pixel level, the number of samples in small areas is far less than that in larger ar...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62G06N3/04
CPCG06N3/045G06F18/214
Inventor 刘芳李玲玲王哲焦李成陈璞花郭雨薇马文萍杨淑媛侯彪
Owner XIDIAN UNIV
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