Analog-to-digital converter and analog-to-digital conversion method

An analog-to-digital converter and analog-to-digital conversion technology, applied in the field of analog-to-digital converters and analog-to-digital conversion, can solve the problems of low speed of ΣΔADC and large area of ​​high-speed SARADC, etc., to reduce chip area, accelerate quantization speed, and The effect of number reduction

Inactive Publication Date: 2019-01-15
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
View PDF11 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of the above problems, in order to overcome the shortcomings of the low speed of the ΣΔ ADC and the large area of ​​the high-speed SAR ADC, the present invention provides an analog-to-digital converter on the one hand, including:

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Analog-to-digital converter and analog-to-digital conversion method
  • Analog-to-digital converter and analog-to-digital conversion method
  • Analog-to-digital converter and analog-to-digital conversion method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below. Apparently, the described embodiments are some, not all, embodiments of the present invention. Based on the described embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0023] Unless otherwise defined, the technical terms or scientific terms used in the present invention shall have the usual meanings understood by those skilled in the art to which the present invention belongs.

[0024] figure 1 It is a schematic structural diagram of an analog-to-digital converter according to an embodiment of the present invention, such as figure 1 As shown, it includes M-bit ΣΔ ADC and N-M-bit SAR ADC (M and N are both integers greater than or ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

An analog-to-digital converter is characterized by comprising an M-bit delta modulation analog-to-digital converter for performing high-order M-bit quantization on an input analog signal in order to convert the input analog signal into a high-order M-bit quantized code value; and a N-M-bit successive approximation analog-to-digital converter for performing low-order N-M-bit quantization on the input analog signal to convert the input analog signal into a low-order N-M-bit quantized code value, merging the M-bit high-order digital code value and the N-M-bit lower-order digital code value into an N-bit digital signal and outputting the N-bit digital signal, wherein M and N are both integers greater than or equal to 1 and N is greater than M. The analog-to-digital converter combines an [sigma][delta]ADC with an SAR ADC, and has the advantages of high speed and small area on the basis of high precision.

Description

technical field [0001] The invention relates to the field of integrated circuit design, in particular to an analog-to-digital converter and an analog-to-digital conversion method. Background technique [0002] With the rapid development of semiconductor manufacturing technology, analog-to-digital converters (ADCs) have been widely used in various fields to convert analog signals into digital signals. [0003] There are two common implementations of existing ADCs: delta modulation ADC (∑Δ ADC) and successive approximation ADC (SAR ADC). The ΣΔ ADC adopts oversampling and noise shaping technology, and can easily achieve a precision of more than 12bit; but because its precision is directly determined by its oversampling rate, its conversion rate is greatly limited in the case of a high precision of more than 12bit. Therefore, ΣΔ ADC is difficult to be applied in occasions with high-speed requirements. The conversion period of the SAR ADC is very short, and the N-bit SAR ADC o...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/38H03M3/00
CPCH03M1/38H03M3/458
Inventor 徐文静陈杰高岑
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products