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X-ray fluorescence spectrometer

A fluorescence spectrometer and X-ray technology, which is applied in the field of X-ray fluorescence spectrometer, can solve problems such as image information distortion, and achieve the effects of simplifying structure, reducing cost, and occupying a small space

Pending Publication Date: 2019-02-01
SHENZHEN HELEEX ANALYTICAL INSTR
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The technical problem to be solved by the present invention is to provide an X-ray fluorescence spectrometer, which can avoid the distortion of the image information collected by the macro lens without affecting the working efficiency of the ray tube

Method used

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Experimental program
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Embodiment 1

[0031] Such as Figure 1 to Figure 5 As shown, an X-ray fluorescence spectrometer in this embodiment includes: a machine (not shown in the drawings), a sample stage 1, an X-ray tube generating device 2, a detector 7, a camera 3, and a transfer switching device 4 and a control device; the sample stage 1 is horizontally arranged on the machine platform for containing samples; the described X-ray tube generating device 2 is arranged on the machine platform and directly above the sample platform 1 for emitting X The ray is irradiated to the sample, and the X-ray is perpendicular to the upper surface of the sample table 1. The X-ray tube generating device 2 includes a tube housing 21 arranged on the machine platform, and the tube housing 21 is provided with There is a ray exit port 22 for X-rays to pass through; the detector 7 is arranged on the machine platform and is located on the side of the sample stage 1, and is used to detect the fluorescence generated by the sample being ir...

Embodiment 2

[0034] In Embodiment 1, in order to prevent X-rays from interfering with the camera during the process of collecting the sample image by the camera and reducing the image quality, the X-ray tube generating device needs to be turned off during the process of collecting the sample image.

[0035] Such as Figure 6 to Figure 9 As shown, on the basis of Embodiment 1, the present embodiment is provided with a shielding plate 5 for shielding X-rays on the sliding seat 42 and directly above the camera 3. The shielding plate 5 can prevent X-rays from interfering with the camera, so there is no need to Turn off the X-ray tube generator.

[0036] In addition, in order to control the amount of X-rays irradiated on the sample, an aperture 6 for reducing the X-rays irradiated on the sample is provided on the side of the sliding seat 42 and the camera 3, and the aperture 6 can be controlled by It is made of X-ray-shielding material, and the aperture 6 is provided with an aperture 61 for pa...

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Abstract

The invention discloses an X-ray fluorescence spectrometer, comprising a bench, a sample stage, an X-ray generator, a detector, a camera, a transfer switching device, and a control device. The samplestage is horizontally arranged on the bench; the X-ray generator is arranged on the bench and directly above the sample stage, the X-ray is perpendicular to the upper surface of the sample stage, andthe X-ray generator comprises a ray tube casing arranged on the bench, the ray tube casing is provided with a ray emitting port for the X-rays to pass through. The camera is connected to the lower part of the ray tube casing; the transfer switching device is arranged between the ray tube casing and the camera for driving the camera to move horizontally relative to the X-ray generator, by which thecamera and the ray emitting port are coaxial or staggered. The control device is configured to receive and analyze the fluorescence generated by the sample collected by the detector. The image information collected by the macro lens can be prevented from being distorted without affecting the working efficiency of the ray tube.

Description

【Technical field】 [0001] The invention relates to a precision detection instrument, in particular to an X-ray fluorescence spectrometer. 【Background technique】 [0002] XRF stands for X-ray Fluorescence Spectroscopy (X Ray Fluorescence). A typical X-ray fluorescence spectrometer (abbreviated as XRF, or XRFS, X Ray Fluorescence Spectrometer) consists of an excitation source (X-ray tube) and a detection system. The X-ray tube generates incident X-rays (primary X-rays) to excite the sample to be measured. The elements in the excited sample will emit secondary X-rays, that is, characteristic fluorescence, and the secondary X-rays emitted by different elements have specific energy characteristics and wavelength characteristics. The detection system measures the energy and intensity of these emitted secondary X-rays. XRF instruments are often equipped with a CCD camera or camera for observing samples and recording images. XRF instruments are also often equipped with a sample s...

Claims

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Application Information

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IPC IPC(8): G01N23/223
CPCG01N23/223G01N2223/076
Inventor 李京芮
Owner SHENZHEN HELEEX ANALYTICAL INSTR
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