Three-dimensional imaging method of shale nanopores by focused ion beam-helium ion microscope
A technology of focused ion beam and nanopore, which is used in material analysis, sampling, and instrumentation using wave/particle radiation to achieve good signal-to-noise ratio, avoid damage, and stabilize slice thickness.
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[0051] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the embodiments and accompanying drawings. Here, the exemplary embodiments of the present invention and their descriptions are used to explain the present invention, but not to limit the present invention.
[0052] On the contrary, the invention covers any alternatives, modifications, equivalent methods and schemes within the spirit and scope of the invention as defined by the claims. Further, in order to make the public have a better understanding of the present invention, some specific details are described in detail in the detailed description of the present invention below. The present invention can be fully understood by those skilled in the art without the description of these detailed parts.
[0053] In an embodiment of the present invention, a focused ion beam-helium ion microscope is ...
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