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A Method for Automatically Detecting Arc Defects in Bonding Wires of Discrete Devices Using X-ray

A discrete device, automatic detection technology, applied in material analysis using radiation, material analysis using wave/particle radiation, instruments, etc., can solve problems such as low reliability and effectiveness, poor consistency, visual fatigue, etc. Achieve the effect of improving service life, improving production efficiency and reducing missed detection rate

Active Publication Date: 2021-05-25
LESHAN PHOENIX SEMICON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In the traditional production process, the method of detecting the arc of the welding wire is to manually observe the X-ray image of the discrete device, and it is necessary to observe the image of one screen and then move the reel to adjust to the next screen for X-ray image observation. A reel full of discrete devices needs to be moved many times and the corresponding number of observations is required. In this way, when detecting welding wire arc defects, the speed is slow. Manual judgment has low reliability and effectiveness, and poor consistency. Using the eyes manually for a long time will cause visual fatigue, and the missed detection rate is high, and for the health of the employees, multiple employees need to rotate work

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  • A Method for Automatically Detecting Arc Defects in Bonding Wires of Discrete Devices Using X-ray
  • A Method for Automatically Detecting Arc Defects in Bonding Wires of Discrete Devices Using X-ray
  • A Method for Automatically Detecting Arc Defects in Bonding Wires of Discrete Devices Using X-ray

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Embodiment Construction

[0049] The present invention will be further described below in conjunction with accompanying drawing:

[0050] Such as figure 1 Shown, a kind of method of applying X-ray automatic detection discrete device welding wire arc defect, comprises the steps:

[0051] S1: X-ray scanning. The X-ray machine automatically scans the products to be tested on the reel to obtain X-ray images of all products. The X-ray machine scans once to obtain an X-ray image, and each X-ray image includes the images of multiple discrete devices. X-ray side view, the X-ray machine scans multiple times to obtain the X-ray images of all the products to be tested on the entire reel, and immediately turns off the X-ray after the scan is completed;

[0052] S2: X-ray image reorganization, automatically reorganize and number the X-ray images of all products to be tested, intercept the X-ray images of a single discrete device in the X-ray image, and rearrange them according to the position of the discrete devic...

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Abstract

The invention discloses a method for automatically detecting arc defects of welding wires of discrete devices by using X-rays, which includes X-ray scanning, an X-ray machine automatically scans the products to be tested on the reel, and obtains X-ray images of all products; X-ray images are recombined , automatically reorganize and number the X-ray images of all products to be tested; image analysis, delineate the effective area analysis frame of the product, and determine whether the line arc image in the effective area analysis frame meets the product specifications, and the products that meet the product specifications are judged as good products. Products that do not meet product specifications are judged as rejects. This method automatically scans the X-ray image of the product to be tested on the reel, automatically reorganizes and numbers the scanned X-ray image of the product, and then automatically analyzes the X-ray of each discrete device according to the line arc specification in the effective position analysis frame. Optical images can be used to judge good products and waste products, which effectively improves the detection speed, and the judgment standard is uniquely determined, which increases the reliability, effectiveness and consistency of detection.

Description

technical field [0001] The invention belongs to the technical field of X-ray detection of discrete devices, and in particular relates to a method for automatically detecting arc defects of welding wires of discrete devices by applying X-rays. Background technique [0002] Discrete devices are one of the branches of the semiconductor industry. Discrete devices have very strict requirements for bonding wire arcs. In the process of producing discrete devices, it is necessary to detect the arcs of the bonding wires of the discrete devices, and the arcs of the bonding wires meet the requirements to be considered good products. [0003] In the traditional production process, the method of detecting the arc of the welding wire is to manually observe the X-ray image of the discrete device, and it is necessary to observe the image of one screen and then move the reel to adjust to the next screen for X-ray image observation. A reel full of discrete devices needs to be moved many time...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/04
CPCG01N23/04G01N2223/1016G01N2223/401G01N2223/421G01N2223/646
Inventor 段练王跃刘丹
Owner LESHAN PHOENIX SEMICON