A Method for Automatically Detecting Arc Defects in Bonding Wires of Discrete Devices Using X-ray
A discrete device, automatic detection technology, applied in material analysis using radiation, material analysis using wave/particle radiation, instruments, etc., can solve problems such as low reliability and effectiveness, poor consistency, visual fatigue, etc. Achieve the effect of improving service life, improving production efficiency and reducing missed detection rate
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[0049] The present invention will be further described below in conjunction with accompanying drawing:
[0050] Such as figure 1 Shown, a kind of method of applying X-ray automatic detection discrete device welding wire arc defect, comprises the steps:
[0051] S1: X-ray scanning. The X-ray machine automatically scans the products to be tested on the reel to obtain X-ray images of all products. The X-ray machine scans once to obtain an X-ray image, and each X-ray image includes the images of multiple discrete devices. X-ray side view, the X-ray machine scans multiple times to obtain the X-ray images of all the products to be tested on the entire reel, and immediately turns off the X-ray after the scan is completed;
[0052] S2: X-ray image reorganization, automatically reorganize and number the X-ray images of all products to be tested, intercept the X-ray images of a single discrete device in the X-ray image, and rearrange them according to the position of the discrete devic...
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