High-precision two-dimensional worktable Z-axis error compensating method and system thereof
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HUAZHONG UNIV OF SCI & TECH
- Publication Date
- 2019-03-08
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of surface topography measurement, and more specifically relates to a high-precision Z-axis error compensation method and system for a two-dimensional workbench, which can effectively compensate Z-axis errors. Background technique
[0002] The three-dimensional surface topography measuring instrument needs the corresponding two-dimensional scanning table to have the characteristics of high positioning accuracy and stable and reliable motion plane. Most of the existing precision two-dimensional worktables use a superimposed two-dimensional scanning platform. Due to the large vertical distance between the stage and the actual X-axis and Y-axis motion modules, the Abbe error is relatively large. And it is more difficult to move a stable datum. Due to the long stroke of the workbench, the accuracy of the displacement of the workbench is greatly affected by the straightness error and mutual influence of the resp...