Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

High-precision two-dimensional worktable Z-axis error compensating method and system thereof

An error compensation and workbench technology, applied in the field of surface topography measurement, can solve problems such as high cost, harsh environmental requirements, and difficult industrial applications

Active Publication Date: 2019-03-08
HUAZHONG UNIV OF SCI & TECH
View PDF4 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the requirements of precision design can be achieved, the cost is too high regardless of the situation of the platform in industrial applications. At the same time, the requirements for the environment are relatively harsh, and industrial applications are very difficult.
Research on two-dimensional worktables at home and abroad mainly focuses on how to ensure high-resolution positioning accuracy. There is no related error method and system design research on the error in the Z-axis direction caused by thermal deformation, guide rail accuracy, and installation error.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-precision two-dimensional worktable Z-axis error compensating method and system thereof
  • High-precision two-dimensional worktable Z-axis error compensating method and system thereof
  • High-precision two-dimensional worktable Z-axis error compensating method and system thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0066] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0067] The high-precision Z-axis error compensation method of the two-dimensional workbench in the present invention, in general, is to set the reference plane 604 on the target area of ​​the two-dimensional workbench to be compensated for the Z-axis error, and then use the capacitive displacement sensor 602 to pass the detection The distance between the capacitive displacement sensor 602 and th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a high-precision two-dimensional worktable Z-axis error compensating method and a system thereof, wherein the Z-axis error compensating device comprises a capacitor displacement sensor (602) and a reference surface (604). The compensating device is used in cooperation with a two-dimensional worktable, wherein the reference surface (604) is used for being set in a target area of the two-dimensional worktable. The capacitor displacement sensor (602) is used for obtaining the displacement of the reference surface (604) in a Z-axis direction through detecting the distance between the capacitor displacement sensor (602) and the reference surface (604). The displacement is the Z-axis error at the target area caused by the two-dimensional worktable, thereby compensating the Z-axis error of the two-dimensional worktable based on the displacement. According to the method and the system, through improving the principle of the Z-axis error compensating method and a means for measuring the Z-axis error, the reference error in the Z-axis direction can be effectively overcome, thereby realizing measurement and compensation of the Z-axis direction error caused by thermal deformation, guide rail precision, mounting error, etc.

Description

technical field [0001] The invention belongs to the technical field of surface topography measurement, and more specifically relates to a high-precision Z-axis error compensation method and system for a two-dimensional workbench, which can effectively compensate Z-axis errors. Background technique [0002] The three-dimensional surface topography measuring instrument needs the corresponding two-dimensional scanning table to have the characteristics of high positioning accuracy and stable and reliable motion plane. Most of the existing precision two-dimensional worktables use a superimposed two-dimensional scanning platform. Due to the large vertical distance between the stage and the actual X-axis and Y-axis motion modules, the Abbe error is relatively large. And it is more difficult to move a stable datum. Due to the long stroke of the workbench, the accuracy of the displacement of the workbench is greatly affected by the straightness error and mutual influence of the resp...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00G01B11/24B25H1/00
CPCB25H1/00G01B11/002G01B11/24
Inventor 陈良洲甘润林王祥阳戴江
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products