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Testing equipment for array substrate, and testing method

A technology for array substrates and testing equipment, which is applied in the field of testing equipment for array substrates, can solve problems such as low efficiency and long testing process time, and achieve the effect of saving test time and process tact

Active Publication Date: 2019-03-08
HKC CORP LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The entire testing process takes a long time and is inefficient

Method used

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  • Testing equipment for array substrate, and testing method
  • Testing equipment for array substrate, and testing method
  • Testing equipment for array substrate, and testing method

Examples

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Embodiment Construction

[0026] Specific structural and functional details disclosed herein are representative only and for purposes of describing example embodiments of the present invention. This invention may, however, be embodied in many alternative forms and should not be construed as limited to only the embodiments set forth herein.

[0027] In describing the present invention, it is to be understood that the terms "central", "lateral", "upper", "lower", "left", "right", "vertical", "horizontal", "top", The orientation or positional relationship indicated by "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying the referred device Or elements must have a certain orientation, be constructed and operate in a certain orientation, and thus should not be construed as limiting the invention. In addition, the te...

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Abstract

The invention discloses testing equipment for an array substrate, and a testing method. The testing equipment for the array substrate comprises a machine table, testing interfaces and testers, whereinthe machine table is used for placing a plurality of array substrates to be tested; the testing interfaces are arranged on the machine table and correspond to each array substrate; and the testers are arranged above the machine table and are cooperated with the testing interfaces to carry out electric stress testing and power-on testing on the array substrate, wherein at least two groups of testers are arranged and synchronously operate according to a preset scheme. Compared with a situation that single group of testers is used for working, the testing equipment utilizes at least two groups of testers so as to equivalently double workloads in unit time, and therefore, testing efficiency is improved.

Description

technical field [0001] The present invention relates to the field of display technology, and more specifically, to a testing device and a testing method for an array substrate. Background technique [0002] Displays controlled by active switches include liquid crystal displays, organic light-emitting diode (Organic Light-Emitting Diode, OLED) displays, and the like. Liquid crystal displays have many advantages such as thin body, power saving, and no radiation, and have been widely used. Among them, the working principle of the liquid crystal panel is to place liquid crystal molecules between two parallel glass substrates, and apply a driving voltage on the two glass substrates to control the rotation direction of the liquid crystal molecules, so as to refract light from the backlight module to produce a picture. OLED displays have many advantages such as self-illumination, short response time, high definition and contrast, flexible display and large-area full-color display....

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/66H01L27/32G02F1/1362
CPCG02F1/1362H01L22/30H01L22/34G02F1/136254H10K59/10G02F2203/69G02F1/1303H10K71/70G01R31/2831G01R31/2844
Inventor 黄北洲
Owner HKC CORP LTD