Spectral basic dimension correction and differential analysis method based on moving least squares method
A technology of least square method and correction method, which is applied in the field of metrology, and can solve problems such as difficult analysis of spectral information, limited use and difficult operation
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0033] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.
[0034] Usually, there is a "digital misalignment" in the sampling spectrum of the infrared spectrum. The so-called "digital misalignment" means that for the same or the same series of samples, the spectrum measured by the instrument is selected in the sampling although the same band and the same resolution are selected when the initial value of the experiment is set, but in the There is often a...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com