Chip surface-mounting identification system and method
A chip placement and identification system technology, applied in the field of optical communication, can solve the problems of placement accuracy, influence placement accuracy, system complexity, etc., to shorten the slow stroke and eliminate the impact of position deviation on placement accuracy. , Improve the effect of patch efficiency
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0044] An embodiment of the present invention provides a chip mounting recognition system, such as figure 2 and image 3 As shown, it includes a photographing device 1, a substrate 2 and an adsorption device 3, the photographing device 1 is located above the substrate 2, the substrate 2 is used for mounting the chip 4, and the adsorption device 3 is used for adsorbing the chip 4 and The chip 4 moves below the photographing device 1, specifically between the photographing device 1 and the substrate 2, the photographing device 1 is used to photograph the substrate 2 and the chip 4, and then identify them by photographing The position of the substrate 2 and the position of the chip 4;
[0045] Wherein, an identification area is provided on the surface of the chip 4, and the identification area can be exposed when the adsorption device 3 absorbs the chip 4, so that when the chip 4 is moved to the bottom of the imaging device 1, the imaging device 1 The identification area on th...
Embodiment 2
[0055] On the basis of the above-mentioned embodiment 1, the embodiment of the present invention also provides a chip mounting identification method, which can be completed by using the chip mounting identification system described in embodiment 1, such as Figure 7 As shown, the method specifically includes the following steps:
[0056] In step 201, the position recognition of the substrate is carried out by the photographing device above the substrate. Wherein, the photographing device 1 acquires the absolute coordinates of the substrate 2 by photographing the recognition point on the surface of the substrate 2; refer to figure 2 , the absolute coordinates of the photographing device 1 are marked as (X, Y), and the acquired absolute coordinates of the substrate 2 are (X+ΔX2, Y+ΔY2).
[0057] Step 202, pick up the chip and move it between the camera and the substrate, and identify the position of the chip by the camera. Such as figure 2 , the chip 4 is sucked by the suct...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com