High-speed test sorting device
A sorting device and detection device technology, applied in sorting and other directions, can solve the problems of low equipment running speed, product type change and conversion, and low UPH of factory production speed, so as to improve work efficiency, facilitate process expansion, and facilitate change and conversion. Effect
Pending Publication Date: 2019-04-26
NORTECH AUTOMATION SHENZHEN CO LTD
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Problems solved by technology
Therefore, modern production plants need a high-speed, high-performance test and sorting equipment to meet their production needs. However, due to the limitations of the mechanical structure of the conventional semiconductor discrete device test and sorting machine, the equipment runs at a low speed and the equipment fails. The production rate is high, the factory production capacity speed UPH is low, and the equipment station process is not easy to expand and the product type is changed, resulting in the inability to meet the high production capacity and high quality production demand
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[0024] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0025] see Figure 1-13 , in an embodiment of the present invention, a high-speed test and sorting device includes a turret pick-and-place module 1, a high-speed feeding module 2, a video detection device 3, a steering correction device 4, an electrical test device 5, and a positioning correction device 6. Marking sub-disc module 7, 3D5S detection module 8, centralized material distribution device 9, tape packaging module 10, reserved expansion station 11, tes...
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The invention discloses a high-speed test sorting device. The upper end of a turret support vertical arm is provided with a transverse connecting vertical arm, the lower left end of the transverse connecting vertical arm is provided with an electrical conversion system, the lower end of the electrical conversion system is provided with an independent pressing mechanism, the lower end of the independent pressing mechanism is provided with a vacuum distributing mechanism, the lower end of the vacuum distributing mechanism is provided with a reclaiming suction nozzle mechanism, the lower end of the reclaiming suction nozzle mechanism is provided with a DDR motor system, the lower end of the DDR motor system is provided with an equipment work table, and the lower end of the equipment work table is provided with an equipment electrical cabinet. The high-capacity and high-quality production requirements of modern factories can be met, the advanced DDR motor and real-time control system and reasonable mechanism design and process distribution are adopted to achieve high-speed and high-performance electrical performance testing, appearance inspection, laser marking, sorting classification,braid packaging and the like for semiconductor splitters, the equipment operation speed is high, the failure rate is low, and product types can be conveniently changed and converted according to production requirements.
Description
technical field [0001] The invention relates to the technical field of industrial automation, in particular to a high-speed testing and sorting device. Background technique [0002] As the semiconductor discrete device industry occupies a pivotal position in the international market and maintains a continuous, rapid and stable development, at the same time, the development of markets such as electronic complete machines and consumer electronics products has increased the demand for semiconductor discrete devices. Therefore, modern production plants need a high-speed, high-performance test and sorting equipment to meet their production needs. However, due to the limitations of the mechanical structure of the conventional semiconductor discrete device test and sorting machine, the equipment runs at a low speed and the equipment fails. The production rate is high, the factory production capacity speed UPH is low, and the equipment station process is not easy to expand and the p...
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IPC IPC(8): B07C5/344B07C5/02B07C5/00B07C5/36
CPCB07C5/00B07C5/02B07C5/344B07C5/362
Inventor 李辉李俊强王体陈俊安
Owner NORTECH AUTOMATION SHENZHEN CO LTD