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Secondary phase error compensation method and device for digital holographic microscopy

A technology of digital holographic microscopy and secondary phase error, which is applied to measurement devices, optical devices, instruments, etc., can solve the problem of inability to eliminate secondary phase errors, etc. Secondary phase error, the effect of low system cost

Inactive Publication Date: 2019-05-07
JIAYING UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This technical solution cannot eliminate the quadratic phase error in the phase diagram

Method used

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  • Secondary phase error compensation method and device for digital holographic microscopy
  • Secondary phase error compensation method and device for digital holographic microscopy
  • Secondary phase error compensation method and device for digital holographic microscopy

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Experimental program
Comparison scheme
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Embodiment 1

[0059] This embodiment includes the following steps:

[0060] Step S101, using a digital holographic microscope system to collect a hologram of the object to be tested as an original hologram;

[0061] Specifically, this embodiment uses a digital holographic microscope system as a system structure, and uses a CCD camera in the digital holographic microscope system to collect a hologram of the object to be measured as an original hologram.

[0062] Step S102, performing a 180° transformation operation on the original hologram to obtain a digital reference hologram as a transformed hologram;

[0063] Specifically, the present invention only needs to collect one hologram, and then perform a 180° rotation transformation operation on the hologram to obtain another digital reference hologram as a transformation hologram.

[0064] Step S103, using the Fourier transform method in the digital holographic microscope to perform phase recovery processing on the original hologram to obtai...

Embodiment 2

[0072] Embodiment 2 is the same as Embodiment 1 in terms of steps and flow, except that in step S102, the original hologram is flipped upside down to obtain a digital reference hologram as a transformed hologram.

[0073] In order to test the effectiveness of the quadratic phase compensation method based on the up-down flip transformation, in this embodiment, a simulated microsphere is selected as the object to be measured to obtain a corresponding quadratic phase error compensation result. image 3 is the phase distribution of the simulated microsphere, Figure 4 is the original hologram of the object to be tested. After the original hologram is flipped up and down, the up and down flipped transformed holograms are obtained as follows: Figure 10 shown. For the hologram, the Fourier transform method is used to extract the +1-level spectrum respectively, and the obtained unfolded phase distribution is as follows: Figure 5 , Figure 11 As shown, according to the method prop...

Embodiment 3

[0075] Embodiment 3 is the same as Embodiment 1 in terms of steps and flow, except that in step S102, the original hologram is flipped left and right to obtain a digital reference hologram as a transformed hologram.

[0076] In order to test the effectiveness of the quadratic phase compensation method based on the left-right flip transformation, in this embodiment, a simulated microsphere is selected as the object to be measured to obtain a corresponding quadratic phase error compensation result. image 3 is the phase distribution of the simulated microsphere, Figure 4 is the original hologram of the object to be tested. After the original hologram is flipped left and right, the left and right flipped transformed holograms are obtained as follows: Figure 14 shown. For the hologram, the Fourier transform method is used to extract the +1-level spectrum respectively, and the obtained unfolded phase distribution is as follows: Figure 5 , Figure 15 As shown, according to the...

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Abstract

The invention discloses a secondary phase error compensation method for digital holographic microscopy, comprising the steps of: collecting a hologram of an object to be tested as an original hologram; performing a geometric transformation operation on the original hologram to obtain a transformed hologram; extracting +1-level spectrum from the spectrum of the original hologram, removing the tiltphase error in the +1-level spectrum, then converting to obtain an original unwrapped phase diagram FORMULA referred; extracting +1-level spectrum from the spectrum of the transformed hologram, removing the tilt phase error in the +1-level spectrum, then converting to obtain a transformed unwrapped phase diagram FORMULA referred; and subtracting the original unwrapped phase diagram FORMULA referred and the transformed unwrapped phase diagram FORMULA referred to obtain a phase diagram after secondary phase error compensation of the original unwrapped phase diagram. A secondary phase error compensation device comprises an acquisition module, a transformation module, a first processing module, a second processing module, and a compensation module. The invention has the advantage of being possible to eliminate secondary phase errors simply and accurately by geometric transformation.

Description

technical field [0001] The invention relates to the technical field of optical imaging correction, in particular to a digital holographic microscope secondary phase error compensation method and a device thereof. Background technique [0002] In traditional digital holographic microscopy systems, the lateral resolution of quantitative phase measurement can be improved by using a microscopic objective lens. However, the use of a microscopic objective lens will cause a mismatch between the wavefronts of the optical path of the object light and the optical path of the reference light, and introduce a secondary phase error. Quantitative Phase Measurement Accuracy. [0003] In order to obtain accurate phase distribution, physical compensation method and numerical compensation method are used in the prior art to eliminate the secondary phase error introduced by the microscopic objective lens. In the physical compensation method, the optical path of the object light can adopt a te...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B9/021G01B9/04G03H1/00G03H1/04G03H1/16
Inventor 邓定南钟远聪杨伟志罗劲明朱仲邃陈昭炎
Owner JIAYING UNIV
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