Voltage sag source identification method based on mutual approximation entropy

A voltage sag source and mutual approximate entropy technology, applied in the fault location and other directions, can solve the problems of difficult convergence and complex algorithms, and achieve the effect of avoiding difficult convergence, high identification efficiency, and high accuracy.

Active Publication Date: 2019-05-31
SOUTHEAST UNIV
View PDF3 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Purpose of the invention: Aiming at the deficiencies in current research on voltage sag source identification, the purpose of this invention is to provide a voltage sag source identification method based on mutual approximation entropy to effectively avoid problems such as difficult convergence and overly complex algorithms in traditional methods

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Voltage sag source identification method based on mutual approximation entropy
  • Voltage sag source identification method based on mutual approximation entropy
  • Voltage sag source identification method based on mutual approximation entropy

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0063] Model parameters:

[0064] according to Figure 4 Voltage transient three-phase vector diagrams under various short-circuit fault conditions, using MATLAB and formulas to establish sample waveform data of 7 types of sags. In this method, the initial length of the window is m=2, and the similarity tolerance r=0.3.

[0065] Take 350 sets of actual voltage sag waveform data, and calculate the mutual approximation entropy between the actual waveform and the 7 types of sample waveforms in the sample library. The average mutual approximation entropy and the actual sag waveform are shown in Table 1. The mutual approximate entropy between the actual waveform and the sample waveforms of the sag type is the smallest, with an average value of about 0.3; the mutual approximate entropy between the actual waveform and sample waveforms of other sag types is large, with an average value between 0.6 and 1. This method is easy to classify when matching waveforms, and has good discrimin...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a voltage sag source identification method based on mutual approximation entropy. The method comprises the steps of: (1) establishing a sample waveform library; (2) performingdata preprocessing; (3) calculating mutual approximate entropy values of a waveform to be matched and the sample waveform, and retaining the minimum entropy value therein and the information of the corresponding sample; and (4) performing sag source type identification: determining whether the minimum entropy value is in a threshold range or not, if not, determining that a pending result is reliable, namely, the waveform to be matched being the sag source type, or else, determining that the waveform to be matched does not belong to any one sag source type in the waveform library. The voltage sag source identification method has high accuracy at the aspect of actually measured waveform identification of the voltage sag source, is short in the required sampling window and simple and easy toimplement the algorithm, help engineers with correct determination of the voltage sag source types and the generation reasons to a certain extent to provide targeted theoretical guidance for treatmentof the voltage sag source problem, and has great application value and prospects.

Description

technical field [0001] The invention relates to a power quality disturbance source identification method, in particular to a voltage sag source identification method based on mutual approximate entropy. Background technique [0002] With the increasing level of industrial equipment, building electrical automation and intelligence, the impact of voltage sag on the production and operation of large industrial and commercial users is becoming more and more significant, especially in semiconductor manufacturing, precision instrument processing, and automobile manufacturing. The electronic equipment industry is very sensitive to voltage sags. When the effective value of the voltage is lower than 90% and the duration reaches 1 to 2 cycles, it will trip and stop. Voltage sag is a common power quality problem. Motor starting, transformer switching, short-circuit faults, etc. will cause voltage sag. Production interruption and delay caused by voltage sag interference are on the rise....

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/08
Inventor 郑建勇李丹奇梅飞沙浩源叶昱媛李陶然佘昌佳吴建章
Owner SOUTHEAST UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products