IV characteristic and deep residual network-based photovoltaic array fault diagnosis method
A technology for fault diagnosis and photovoltaic arrays, applied in photovoltaic power generation, photovoltaic modules, photovoltaic system monitoring, etc., can solve problems such as fault diagnosis and classification of photovoltaic power generation arrays with residual convolution neural network algorithms that have not yet been seen, and achieve robustness Strong performance and generalization ability, efficient and accurate application, high precision and stability
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0056] The technical scheme of the present invention will be described in detail below in conjunction with the drawings.
[0057] The present invention provides a photovoltaic array fault diagnosis method based on IV characteristics and deep residual network, including the following steps:
[0058] Step S1. Use Simulink to build a model array, simulate various working conditions, collect electrical data and environmental data under various working conditions, which specifically include: the IV characteristic curve obtained by scanning the model array under corresponding working conditions and Corresponding illuminance and irradiance;
[0059] Step S2. Remove the abnormal data from the original simulated data, down-sample the original IV curve collected, and perform feature stitching on the four one-dimensional features of current, voltage, temperature and irradiance to obtain two Dimensional feature, this two-dimensional feature is regarded as the overall feature of the fault;
[006...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com