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A sub-junction analysis method of a solar cell structure containing a complete multi-junction compound

A technology of a solar cell and an analysis method, which is applied in the field of subjunction analysis including a complete multi-junction compound solar cell structure, can solve the problems that the simulation is not intuitive, cumbersome, and cannot be done in one step, and achieves strong analysis convenience and accuracy. Performance analysis is fast and accurate, the method is convenient and simpler

Active Publication Date: 2019-06-18
上海垒芯半导体科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] 1. On the one hand, the current method is relatively cumbersome. It is necessary to conduct separate simulation analysis of each sub-junction solar cell and then integrate the complete multi-junction solar cell to analyze the overall performance. This kind of split work is not intuitive enough for simulation. Moreover, when analyzing the interaction of light absorption between sub-junctions, it cannot be done in one step, which is very inefficient. Furthermore, it is not convenient for mass analysis of multi-junction solar cells, especially four-junction or even more junctions. ;
[0006] 2. On the other hand, it is especially important that since sunlight is incident into a multi-junction solar cell, it is a series of linkage behaviors. This separate simulation analysis cannot accurately reflect the real behavior of each sub-junction in a complete cell. When simulating a complete multi-junction structure, it is also difficult to directly evaluate whether the current-matching and other conditions between the sub-junctions have been achieved to achieve the best battery performance.

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  • A sub-junction analysis method of a solar cell structure containing a complete multi-junction compound
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  • A sub-junction analysis method of a solar cell structure containing a complete multi-junction compound

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Embodiment Construction

[0032] In order to make the purpose, technical solutions and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with specific examples. It should be understood that these descriptions are exemplary only, and are not intended to limit the scope of the present invention. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present invention.

[0033] This embodiment uses the APSYS software of Canadian Crosslight Company (the method of the present invention is not limited to this software), and takes a four-junction solar cell as an example to demonstrate the method:

[0034] Figure 5 It is a complete four-junction solar cell epitaxial thin-film structure, sunlight is incident from the top of the cell, and passes through the entire four-junction junction 1 top cell a, junction 2 middle cell b, junction 3 ...

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Abstract

The invention discloses a sub-junction analysis method for a solar cell structure containing a complete multi-junction compound, which comprises the following steps of: virtually cutting off the leftside and the right side of other sub-junctions to ensure that anodes and cathodes of the other sub-junctions are just positioned in doping regions on the two sides of a single-junction cell structure;Obtaining a simulation structure chart of each sub-junction; Obtaining a curve graph of the change of the performance of each sub-junction along with the trap density of the material in the absorption region; Determining the trap density required by the short-circuit current which is the same as the experimental measurement value of each sub-junction, determining the sensitivity of each sub-junction to the trap capture cross section, and determining the current limiting junction; Adjusting trap parameters of other sub-junctions to enable the final open-circuit voltage to be the same as the experimental value; Carrying out simulation fitting on the whole experimental measurement result; And analyzing the relationship between the fitting defect density of the other sub-junctions and the defect density required for reaching the limited current, and optimizing the sub-junctions which are not reached. The method provided by the invention is simple and can accurately reflect the real behavior of each sub-junction in the complete battery.

Description

technical field [0001] The invention relates to the technical field of solar cells, in particular to a sub-junction analysis method including a complete multi-junction compound solar cell structure, which has a simple method and can accurately reflect the real behavior of each sub-junction in a complete battery. Background technique [0002] Simulation analysis is an effective method for multi-junction solar cell research. At present, the means of simulation and analysis of multi-junction solar cells is mainly based on the separate simulation of sub-junctions. Specifically, with the help of software such as PC1D AMPS and APSYS, a separate numerical simulation based on semiconductor drift and diffusion theory is carried out for each sub-junction, and each sub-junction is analyzed. The performance of the sub-junction battery is affected by changes in material properties, such as the impact of the minority carrier lifetime of the material on the I-V curve of the sub-junction, a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
Inventor 杨猛
Owner 上海垒芯半导体科技有限公司