Real-time temperature monitoring system and method for integrated circuit testing device

Abstract

The invention relates to a real-time temperature monitoring system and method for an integrated circuit testing device, thereby solving problems that the stability and precision of the testing deviceare affected by the too high temperature to cause the test offset and thus the serious quality is caused. The system comprises a host terminal and a testing terminal. The testing terminal includes a plurality of temperature detecting units and a temperature analyzing unit; the temperature detecting units are connected to the temperature analyzing unit respectively; and the temperature analyzing unit is connected to the host terminal. The host terminal reads temperature data in real time; when the temperature value is higher than an early warning threshold, alarming is performed; and when the temperature value is higher than a detection stop threshold, alarming is performed and current testing is stopped. According to the invention, the internal temperature of the integrated circuit test equipment can be monitored; alarming is performed when the temperature is too high and testing can be stopped in a forced manner, so that problems that the test stability of the testing device is reduced and the testing precision offset is caused because the heat in the testing device is not dissipated timely and the internal temperature of the testing device is too high are solved.

Description

technical field [0001] The invention relates to the technical field of test instruments, in particular to a real-time temperature monitoring system and method for integrated circuit test equipment. Background technique [0002] At present, various industries pay more and more attention to the manufacturing, testing, storage and other links of products, such as medicinal materials, food, semiconductors, etc. In order to control the quality of each link of the product, it is necessary to strictly control the temperature. Therefore, the implemented temperature monitoring system maintains strict Temperature data has become an industry norm [0003] In the field of integrated circuit testing, temperature monitoring and control play a very important role. Excessively high temperatures will seriously affect the temperature characteristics of electronic devices, which in turn will affect the stability and accuracy of test equipment, resulting in test deviations and serious consequen...

AI Technical Summary

Problems solved by technology

[0004] The present invention mainly solves the problem in the prior art that excessive temperature affects the stability and precision of the test equipment, which leads to test deviation and serious consequences, and provides a real-time temperature monitoring system and method for integrated circuit test equipment

The invention can monitor the internal temperature of the integrated circuit test equipment, and at the same time, can give an alarm when the temperature is too high, and can force the test to be stopped, and overcomes the failure of the test equipment caused by the untimely heat dissipation inside the test equipment and the high internal temperature of the test equipment. The problem of stability decline and test accuracy offset

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