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A Calibration Method for Micro Spectrometer Based on Least Square Method

A miniature spectrometer and least squares technology, applied in the field of spectrometer calibration, can solve the problems of slow calibration speed and large error, and achieve the effect of accurate calibration

Active Publication Date: 2021-05-18
ZHEJIANG UNIV OF TECH
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Problems solved by technology

[0004] In order to solve the problems of slow calibration speed and large errors caused by human factors in the existing micro-spectrometer, the present invention combines the characteristics of the micro-spectrometer and the polynomial fitting of the least squares method, first obtains the image of the standard light source, and uses a method to automatically find the maximum value Match the characteristic wavelength with the corresponding pixel point, and finally solve the fifth-order polynomial fitting coefficient based on the least square method, and complete the automatic calibration of the spectrometer. The process according to the present invention is also applicable to the calibration of other miniature spectrometers

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  • A Calibration Method for Micro Spectrometer Based on Least Square Method
  • A Calibration Method for Micro Spectrometer Based on Least Square Method
  • A Calibration Method for Micro Spectrometer Based on Least Square Method

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Embodiment Construction

[0054] The present invention will be further explained in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0055] refer to Figure 1 ~ Figure 4 , a method for calibrating a miniature spectrometer based on the least squares method, comprising the following steps:

[0056] 1) obtain the spectral image of the mercury-argon standard light source, the present invention's test is based on the Windows development environment, use WPF to write the mode of miniature spectrometer upper computer software to obtain and display the spectrometer image under the .NET platform, the process is as follows:

[0057] 1.1) The mercury-argon lamp is connected to the micro-spectrometer through an optical fiber, and the micro-spectrometer is connected to the computer;

[0058] 1.2) The user adjusts the integration time of the micro-spectrometer through the host computer software of the micro-spectrometer, compares the mercury-argon standard light sour...

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Abstract

A method for calibrating a miniature spectrometer based on the least square method relates to the technical field of spectrometer calibration and solves the problem of lack of a simple, fast and accurate calibration for the miniature spectrometer. The method comprises the following steps: 1) acquiring a spectral image of a mercury-argon standard light source; 2) automatically searching for a maximum value, extracting and matching pixel points corresponding to known characteristic spectral lines of the standard calibration light source and spectral line peaks; 3 ) performing polynomial fitting on the pixel serial number and the corresponding wavelength by the least square method; 4) storing the fitted polynomial coefficients in the spectrometer. The invention provides a calibration method for the micro-spectrometer based on the least square method which can calibrate the micro-spectrometer simply, quickly and accurately.

Description

technical field [0001] The invention belongs to the technical field of spectrometer calibration, and relates to a method for calibrating a miniature spectrometer based on a least square method, and is especially suitable for calibrating a miniature spectrometer. Background technique [0002] In modern engineering applications, spectrometers play an increasingly important role in the detection of components. Since each object component has its own unique spectral curve, the correct result can be obtained quickly and accurately by analyzing and detecting the substance with a spectrometer. Compared with other detection methods, the spectrometer has a unique advantage in being non-destructive to substances. After the spectrometer is designed and manufactured, it will use the grating formula to directly calculate the specific position of the wavelength. This method usually has certain errors. In order to obtain accurate measurement results, it needs to undergo strict calibration ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/28
CPCG01J3/28
Inventor 陈朋韩洋洋严宪泽
Owner ZHEJIANG UNIV OF TECH
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