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High and low temperature infrared imaging system detection device

A technology of an infrared imaging system and a detection device, which is applied in the field of optical testing and can solve problems such as the inability to realize the simulation test of a complex background target in a deep space background.

Active Publication Date: 2021-01-08
BEIJING ZHENXING METROLOGY & TEST INST
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  • Abstract
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Problems solved by technology

[0003] The invention provides a detection device for a high and low temperature infrared imaging system, which can solve the technical problem that the detection device for a mid-infrared imaging system in the prior art cannot realize the target simulation test under deep space background, complex background and wide temperature range

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Embodiment Construction

[0005] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. The following description of at least one exemplary embodiment is merely illustrative in nature and in no way taken as limiting the invention, its application or uses. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0006] It should be noted that the terminology used here is only for describing specific implementations, and is not intended to limit t...

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Abstract

The invention provides a detection device for a high and low temperature infrared imaging system. The detection device for a high and low temperature infrared imaging system includes a platform support assembly, a target blackbody assembly, a background blackbody assembly, a target assembly, a high and low temperature optical assembly, a first adiabatic mechanism and a second Second, the adiabatic mechanism, the target black body assembly, the background black body assembly and the target assembly can be detachably arranged on the platform support assembly, the target infrared radiation generated by the target black body assembly and the background infrared radiation generated by the background black body assembly pass through the target assembly Enter the high and low temperature optical components to form an infrared target with a background, the first athermal difference mechanism is used to ensure that the distance between the target component and the secondary mirror unit is constant, and the second athermal difference mechanism is used to ensure that the secondary mirror unit and the main mirror unit The distance between the mirror units does not change. The technical solution of the present invention is applied to solve the technical problem that the detection device of the mid-infrared imaging system in the prior art cannot realize the target simulation test under deep space background, complex background and wide temperature range.

Description

technical field [0001] The invention relates to the technical field of optical testing, in particular to a detection device for a high and low temperature infrared imaging system. Background technique [0002] Infrared imaging seeker is more and more widely used in modern missile weapon systems because of its strong anti-interference ability and high guidance precision. During the laboratory simulation test of the infrared imaging seeker, the infrared imaging system detection device is the most important simulation test equipment used. The infrared imaging system detection device can simulate the infrared information of the target actually observed in the actual combat process of the infrared imaging seeker, and form a specific infrared target to guide the infrared imaging seeker in the early design and mid-term test process of the infrared imaging seeker. It is found that it is not enough to carry out cyclical improvement design, reduce development iterations, and shorten ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/00G01J5/52
CPCG01J5/00G01J2005/0077G01J5/53
Inventor 吴柯萱杜继东王志曹清政宋春晖何立平郭亚玭
Owner BEIJING ZHENXING METROLOGY & TEST INST
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