Compensation method of error of contact biological cell imaging scanning through atomic power probe

Abstract

The invention provides a compensation method of the error of contact biological cell imaging scanning through an atomic power probe. The compensation method comprises the steps that the atomic power probe is utilized to conduct contact imaging scanning on the same cell area sequentially in the zero-degree (I) direction, the 45-degree (II) direction, the 90-degree (III) direction, the 135-degree (IV) direction, the 180-degree (V) direction, the 225-degree (VI) direction, the 270-degreen (VII) direction and the 315-degree (VIII) direction, and thus cell morphological images in the eight directions are obtained; and in the cell morphological image in the zero-degree (I) direction, a square image with cells as the center is selected as a template, cell fusion images are sequentially selected from the cell morphological images in the 45-degree (II) direction, the 90-degree (III) direction, the 135-degree (IV) direction, the 180-degree (V) direction, the 225-degree (VI) direction, the 270-degreen (VII) direction and the 315-degree (VIII) direction, the selected cell morphological images are subjected to image fusion, and thus the shadow problem occurring during contact cell morphology imaging scanning through the atomic power probe can be effectively eliminated. The morphology error occurring during cell imaging scanning is effectively compensated, and thus the cell morphology imaging quality is improved.

Description

technical field [0001] The invention belongs to the technical field of microscopic imaging, in particular to the field of cell shape imaging, and relates to a method for compensating imaging errors of atomic force probe contact scanning biological cells. Background technique [0002] Cells are the basic unit of living organisms. It is an important subject of scientific research to conduct cell differentiation and cell function analysis by understanding the morphology of cells and measuring the physical characteristics of cells. The atomic force microscopy imaging system utilizes the atomic interaction force between the tip of the probe (11) and the sample, and can perform morphology imaging and physical property measurement of micro-nano-sized samples. Using atomic force probes to scan and image the topography of cells is a reliable method for imaging cell topography. Commonly used scanning methods for AFM imaging include contact scanning mode and tapping scanning mode. Am...

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Problems solved by technology

[0003] The surface of the cell is relatively soft. During the contact mode scanning and imaging of the cell with the atomic force probe, the force set between the probe and the cell surface is smaller than that of the hard material when scanning the image, and because of the large height difference of the cell, the When the area with a large slope is imaged by contact scanning, piezoelectric ceramics cannot be adjusted quickly in the vertical direction in real time, resulting in a large error in the morphology of the cell scanning image in this area, which makes the cell morphology obtained by contact scanning imaging The detection accuracy is greatly reduced

[0004] At present, when the existing atomic force probes use contact scanning to scan the topography of biological cells, they all use unidirectional scanning and imaging. When performing unidirectional scanning and imaging of cells, there will be shadows in areas with large cell height differences, making the There is a large error in the cell topography map of the area, and the detection accuracy of the cell topography map decreases

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