A Compensation Method for Imaging Errors of AFM Contact Scanning Biological Cells
A technology of biological cells and imaging errors, which is applied in the field of microscopic imaging and cell morphology imaging, can solve the problems of cell scanning image morphology errors, cell morphology map errors, and large cell height differences, so as to improve the fusion effect and high The effect of fusion degree and high detection accuracy
Active Publication Date: 2021-08-06
CHANGCHUN UNIV OF SCI & TECH
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[0003] The surface of the cell is relatively soft. During the contact mode scanning and imaging of the cell with the atomic force probe, the force set between the probe and the cell surface is smaller than that of the hard material when scanning the image, and because of the large height difference of the cell, the When the area with a large slope is imaged by contact scanning, piezoelectric ceramics cannot be adjusted quickly in the vertical direction in real time, resulting in a large error in the morphology of the cell scanning image in this area, which makes the cell morphology obtained by contact scanning imaging The detection accuracy is greatly reduced
[0004] At present, when the existing atomic force probes use contact scanning to scan the topography of biological cells, they all use unidirectional scanning and imaging. When performing unidirectional scanning and imaging of cells, there will be shadows in areas with large cell height differences, making the There is a large error in the cell topography map of the area, and the detection accuracy of the cell topography map decreases
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Embodiment 1
[0051] Before compensating for cell topography imaging, the AFM probe was first calibrated in a plane. Utilize scanning probe 11 for such Figure 4 A planar calibration substrate engraved with a cross-shaped pattern is scanned and imaged as shown, Figure 4 The calibration substrate in is to use a focused ion beam to etch a cross pattern in the central area of a square silicon wafer with a side length of 20mm. composition.
[0052] according to figure 1 As shown, sequentially for 0°(I), 45°(II), 90°(III), 135°(IV), 180°(V), 225°(VI), 270°(VII), 315°( VIII) Scan imaging in eight directions. Read the center coordinates of the cross pattern in eight scanned images respectively: 0 ° (I) direction is (x1, y1); 45 ° (II) direction is (x2, y2); 90 ° (III) direction is ( x3, y3); 135° (IV) direction is (x4, y4); 180° (V) direction is (x5, y5); 225° (VI) direction is (x6, y6); 270° (VII) direction is (x7, y8); the 315° (VIII) direction is (x8, y8).
[0053] The horizontal cali...
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The invention provides a method for compensating imaging errors of atomic force probe contact scanning biological cells, using the atomic force probe to sequentially scan the same cell area from 0° (I), 45° (II), 90° (III), 135° (IV), 180°(V), 225°(VI), 270°(VII), and 315°(VIII) eight directions for contact scanning imaging to obtain cell topography in eight directions; at 0° In the cell topography diagram of direction (I), a square image centered on the cell is selected as a template, at 45° (II), 90° (III), 135° (IV), 180° (V), 225° ( Select cell fusion images sequentially from the cell topography graphs in the directions of VI), 270° (VII), and 315° (VIII), and perform image fusion on the selected cell topography images, which can effectively eliminate the contact scanning of the cell topography by the atomic force probe. Shadowing issues when imaging. The invention effectively compensates the shape error in cell scanning imaging, thereby improving the quality of cell shape imaging.
Description
technical field [0001] The invention belongs to the technical field of microscopic imaging, in particular to the field of cell shape imaging, and relates to a method for compensating imaging errors of atomic force probe contact scanning biological cells. Background technique [0002] Cells are the basic unit of living organisms. It is an important subject of scientific research to conduct cell differentiation and cell function analysis by understanding the morphology of cells and measuring the physical characteristics of cells. The atomic force microscopy imaging system utilizes the atomic interaction force between the tip of the probe (11) and the sample, and can perform morphology imaging and physical property measurement of micro-nano-sized samples. Using atomic force probes to scan and image the topography of cells is a reliable method for imaging cell topography. Commonly used scanning methods for AFM imaging include contact scanning mode and tapping scanning mode. Am...
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IPC IPC(8): G01Q60/24
CPCG01Q60/24
Inventor 王作斌孙佰顺曹亮杨焕洲宋正勋许红梅
Owner CHANGCHUN UNIV OF SCI & TECH