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Laser interferometric calibration measurement equipment and method for measuring the absolute surface shape of flat crystals

A technology of calibration measurement and laser interference, applied in measurement devices, optical devices, instruments, etc., can solve problems such as difficult to meet fast measurement

Active Publication Date: 2020-10-27
苏州慧利仪器有限责任公司
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

However, there are not only a wide variety of flat crystals to be tested, but also a large number. If all of them are supported by edge rings and the finite element analysis method is used to obtain the self-weight deformation of the flat crystals to be tested, it is difficult to meet the requirements of large quantities of multiple types of flat crystals to be tested. Demand for rapid measurement of flat crystal morphology

Method used

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  • Laser interferometric calibration measurement equipment and method for measuring the absolute surface shape of flat crystals
  • Laser interferometric calibration measurement equipment and method for measuring the absolute surface shape of flat crystals
  • Laser interferometric calibration measurement equipment and method for measuring the absolute surface shape of flat crystals

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Embodiment Construction

[0061] The concept, specific structure and technical effects of the present invention will be further described below in conjunction with the accompanying drawings, so as to fully understand the purpose, characteristics and effects of the present invention.

[0062] figure 1 It is the principle block diagram of the laser interferometric calibration measuring device used to measure the absolute surface shape of the flat crystal in the horizontal measurement state in the embodiment of the present invention; figure 2 It is a schematic diagram of the three-dimensional structure of the laser interferometric calibration measurement device used for measuring the absolute surface shape of a flat crystal when it is in a horizontal measurement state in the embodiment of the present invention; image 3 It is the principle block diagram of the laser interferometric calibration measuring device used for measuring the absolute surface shape of the flat crystal in the vertical measurement s...

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Abstract

The invention provides a laser interferometric calibration and measurement device and method for measuring an optical flat absolute plane shape. A vertical-type laser interferometric measurement device comprises a device main body, a reference optical flat carrying device, an optical flat rotating and carrying device and an optical flat bearing device, wherein the device main body is provided witha collimating lens; the optical flat rotating and carrying device is coaxially arranged with the reference optical flat carrying device and used as a to-be-measured optical flat carrying device in ahorizontal-type measurement state; the optical flat bearing device replaces the optical flat rotating and carrying device, and is used as a to-be-measured optical flat carrying device in a vertical-type measurement state; and the optical flat rotating and carrying device is provided with a fixed disc, a rotating and carrying part and a limiting part, the limiting part is used for limiting a rotating disc in a first position when the rotating disc is switched to the first position and limiting the rotating disc in a second position when the rotating disc is switched to the second position, theoptical flat bearing device is provided with a mounting seat and a bearing part, the bearing part is arranged on the mounting seat, and comprises a bearing component, and the bearing component is provided with a soft bearing plane.

Description

technical field [0001] The invention belongs to the technical field of laser interference measurement equipment, and in particular relates to a laser interference calibration measurement equipment and a measurement method for measuring the absolute surface shape of a flat crystal. Background technique [0002] Laser interferometry equipment, also known as laser interferometer, is a device that uses optical interference technology to measure the topography information of optical parts such as flat crystals. [0003] The three-plane mutual inspection method is the most commonly used measurement method to measure the absolute surface shape information of flat crystals. However, when using the three-plane mutual inspection method to measure the absolute shape of the working surface of the flat crystal, the measured flat crystal needs to be rotated at a certain angle to measure relative to the reference mirror. The deviation of the rotation angle and the deviation of the rotation...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24
CPCG01B11/2441
Inventor 韩森张凌华李雪园刘薇庄锦程
Owner 苏州慧利仪器有限责任公司
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