Method for rapidly presenting specific crystal plane distribution characteristic of polycrystalline material

A technology of polycrystalline materials and distribution characteristics, applied in material analysis using radiation diffraction, material analysis using wave/particle radiation, material analysis, etc., can solve problems such as difficulties in single crystal preparation

Inactive Publication Date: 2019-08-06
INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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  • Abstract
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Problems solved by technology

At present, the qualitative direction is mostly used to study the influence of specific crystal planes on material properties. Some researchers also use the method of preparing single crystals to study the influence of independent crystal grains on specific crystal planes on material properties. However, the preparation of single crystals is very difficult and impossible. It truly reflects the environment of the grains of the actual service materials and the interaction between them, so the research results may be highly subjective

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  • Method for rapidly presenting specific crystal plane distribution characteristic of polycrystalline material
  • Method for rapidly presenting specific crystal plane distribution characteristic of polycrystalline material
  • Method for rapidly presenting specific crystal plane distribution characteristic of polycrystalline material

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Embodiment Construction

[0033] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0034] The sample material is Zircaloy-4 alloy. In order to study the influence of its specific crystal planes {0001}, {11-20} and {10-17} on the material properties, it is necessary to extract the specific crystal planes {0001}, {11-20 } and {10-17} crystal planes. In addition, in order to study the joint effect of different crystal planes on the properties of the alloy, it is also necessary to extract {0001} and {11-20} crystal planes, {0001} or {10-17} crystal planes , the {0001} crystal plane with an angle deviation of 5-10 degrees. A method for quickly presenting the distribution characteristics of a specific crystal plane of a polycrystalline material according to the present invention specifically includes the following steps:

[0035] 1. EBSD sample preparation

[0036] First, cut the EBSD sample (sample size is 10×8×3mm) by wire cut...

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Abstract

The invention provides a method for rapidly presenting a specific crystal plane distribution characteristic of a polycrystalline material. The method has high efficiency, cost is low and operation issimple. A plurality of specific crystal plane orientation characteristics in the polycrystalline material can be accurately presented. The method mainly comprises the following steps of EBSD sample preparation, sample surface information collection by using an electron backscattering diffraction analysis technology, data processing, specific crystal plane presentation and the like. The method canbe used for research of a grain size, distribution and an orientation relationship under the specific crystal plane characteristic, such as the research of an orientation genetic phenomenon of an alloy material in heat treatment and a hot working process. Secondly, the method can be used to explore the relationship between oxidation resistance and corrosion resistance performance of the material and the specific crystal plane distribution characteristic of the material surface. Besides, the method can be used to quantitatively study a combined effect of different crystal planes in the materialand a variety of specific crystal planes on the material performance so as to guide to make reasonable heat treatment and a processing technology in actual production, and fully exert or improve service performance of the material.

Description

technical field [0001] The invention belongs to the technical field of backscattered electron diffraction analysis and the field of material crystallography, and specifically relates to a method for rapidly presenting the distribution characteristics of specific crystal planes of materials by using electron backscattered diffraction (EBSD) technology. Background technique [0002] Most solid materials in nature, such as metals, ceramics, and minerals, are polycrystalline, which are composed of many individual independent grains. The crystal grains in polycrystalline materials, the distribution characteristics of the crystal plane orientation in the reference coordinate system are called orientation. Texture (also known as preferred orientation) will appear in the polycrystal when the orientations of the grains in the polycrystal gather together. Generally, materials will have a certain texture in the original state or after processing due to the influence of various externa...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/203G01N23/20
CPCG01N23/203G01N23/2005
Inventor 李阁平韩福洲刘承泽袁福森张英东郭文斌阿里·穆罕默德顾恒飞
Owner INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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