Construction and application of spectral disease index for identification of wheat scab-infected grains

A technology for wheat scab and wheat grains, which is applied in the construction and application field of spectral disease index identification of wheat scab-infected grains, can solve the problem of large redundancy, time-consuming, and inability to detect wheat scab-infected grains. Taking into account issues such as accuracy and efficiency, to achieve the effect of ensuring high precision and ensuring effectiveness

Active Publication Date: 2021-06-25
ANHUI UNIVERSITY
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Problems solved by technology

However, spectral data has the characteristics of multiple bands, large data volume, large redundancy, and strong correlation. It takes a lot of time to use traditional machine learning classification methods (such as support vector machines, partial least squares linear discriminant methods, etc.)
Generally speaking, the current detection methods for wheat scab-infected grains cannot take into account both the accuracy and efficiency indicators, so the development and application of a recognition method with a light algorithm and a high recognition rate has become a technical problem that needs to be solved urgently

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  • Construction and application of spectral disease index for identification of wheat scab-infected grains
  • Construction and application of spectral disease index for identification of wheat scab-infected grains
  • Construction and application of spectral disease index for identification of wheat scab-infected grains

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Embodiment Construction

[0021] Combine below Figure 1 to Figure 6 , the present invention is described in further detail.

[0022] refer to figure 1 with Image 6 , a spectral disease index construction for identifying wheat scab-infected grains, including the following steps: (A) selecting a plurality of healthy wheat grains and wheat scab-infected grains as a calibration set, collecting the spectral data of the wheat grains in the calibration set, and calculating Average the average spectral curve C of healthy wheat grains 1 and the average spectral curve C of diseased wheat grains 3 , average spectral curve C 1 and C 3 Such as figure 2 Shown; (B) respectively for two average spectral curves C 1 and C 3 The first-order differential processing is performed on each wavelength of healthy wheat grain to obtain the first-order differential spectrum curve C 2 and the first-order differential spectrum curve C of the diseased wheat grain 4 , the first-order differential spectrum curve C 2 and ...

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Abstract

The invention particularly relates to the construction of a spectral disease index for identification of wheat scab-infected grains, comprising the following steps: (A) selecting healthy and infected wheat grains as samples, and collecting and obtaining two average spectral curves; The average spectral curve is subjected to first-order differential processing to obtain two first-order differential spectral curves; (C) solve the wavelength λ according to the two average spectral curves 1 , according to two first-order differential spectral curves to solve the wavelength λ 2 (D) calculate the spectral disease index of each wheat grain; (E) draw its frequency histogram respectively according to the spectral disease index of healthy and infected wheat grain; (F) carry out curve fitting to two frequency histograms, take The intersection point of the two fitting curves is the judgment threshold; a method for detecting wheat scab by using the model is also disclosed. The spectral disease index constructed by the invention has the application advantages of non-destructiveness, fast calculation speed, high precision and good stability.

Description

technical field [0001] The invention relates to the technical field of wheat scab disease detection, in particular to the construction and application of a spectral disease index for identifying wheat scab-infected grains. Background technique [0002] Wheat is one of the food crops with the most extensive planting area and the highest total output in the world, and more than 1 / 3 of the world's population takes wheat products as staple food. Therefore, wheat plays an important role in society and economy, and its quality and safety issues have become a hot research topic at home and abroad. Fusarium head blight (FHB) is a common high incidence of wheat, which can produce 25 kinds of mycotoxins, among which deoxynivalenol (DON) and its acetylated derivatives (3ADON, 15ADON) are the most common. DON, also known as vomitoxin, interferes with the activity of ribosomal peptidyl transferase, hinders ribosomal circulation, inhibits protein synthesis, and causes symptoms such as he...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/25
CPCG01N21/25
Inventor 张东彦王倩梁栋郑玲黄林生尹勋王道勇陈高
Owner ANHUI UNIVERSITY
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