Construction and application of spectral disease index for identification of wheat scab-infected grains
A technology for wheat scab and wheat grains, which is applied in the construction and application field of spectral disease index identification of wheat scab-infected grains, can solve the problem of large redundancy, time-consuming, and inability to detect wheat scab-infected grains. Taking into account issues such as accuracy and efficiency, to achieve the effect of ensuring high precision and ensuring effectiveness
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[0021] Combine below Figure 1 to Figure 6 , the present invention is described in further detail.
[0022] refer to figure 1 with Image 6 , a spectral disease index construction for identifying wheat scab-infected grains, including the following steps: (A) selecting a plurality of healthy wheat grains and wheat scab-infected grains as a calibration set, collecting the spectral data of the wheat grains in the calibration set, and calculating Average the average spectral curve C of healthy wheat grains 1 and the average spectral curve C of diseased wheat grains 3 , average spectral curve C 1 and C 3 Such as figure 2 Shown; (B) respectively for two average spectral curves C 1 and C 3 The first-order differential processing is performed on each wavelength of healthy wheat grain to obtain the first-order differential spectrum curve C 2 and the first-order differential spectrum curve C of the diseased wheat grain 4 , the first-order differential spectrum curve C 2 and ...
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