Camera module and cell silicon wafer defect detection device and method
A camera module and camera fixing technology, which is applied in the direction of measuring devices, supporting machines, mechanical equipment, etc., can solve the problems of camera installation and positioning, alignment adjustment, etc. , fast speed, and the effect of improving the influence of positioning accuracy
Pending Publication Date: 2019-09-03
东莞威森智能科技有限公司
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Problems solved by technology
[0004] The purpose of the present invention is to provide a camera module, a device for detecting defects in silicon wafers of batteries and a detection method, aiming to solve problems such as camera installation and positioning and alignment adjustment in the prior art that have always plagued the detection of solar battery silicon wafers. Technical issues with precision
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[0045] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the embodiments of the present invention and should not be construed as limitations of the present invention.
[0046] In the description of the embodiments of the present invention, it should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical ", "horizontal", "top", "bottom", "inner", "outer" and other indicated orientations or positional relationships are based on the orientations or positional relationships shown in the drawings, and are only for the convenience of describing the embodiments of the present invention and simplifying Describes, but does no...
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The invention belongs to the technical field of solar cell silicon wafer detection, and particularly relates to a camera module and a cell silicon wafer defect detection device and method. The cameramodule comprises an industrial camera, a camera fixing support and a multi-angle adjusting base. The camera fixing support is fixedly connected to the bottom of the multi-angle adjusting base, and theindustrial camera is fixedly installed on the camera fixing support. The multi-angle adjusting base comprises a radial adjusting assembly, an axial adjusting assembly and an angle adjusting assembly,specifically, the radial adjusting assembly, the axial adjusting assembly and the angle adjusting assembly are sequentially connected according to the random order. The ends, located in the connection relationship, of the radial adjusting assembly, the axial adjusting assembly and the angle adjusting assembly are connected with an outer cover of the cell silicon wafer defect detection device, andthe other ends, located in the connection relationship, of the radial adjusting assembly, the axial adjusting assembly and the angle adjusting assembly are connected with the camera fixing support. According to the camera module and the cell silicon wafer defect detection device and method, the purpose of adjusting the posture of the industrial camera can be well achieved through the multi-angleadjusting base, the influence of the installation of the industrial camera on the locating accuracy is effectively reduced, and the visual locating accuracy is improved.
Description
technical field [0001] The invention belongs to the technical field of solar cell silicon wafer detection, and in particular relates to a camera module, a battery silicon wafer defect detection device and a detection method. Background technique [0002] The photovoltaic industry is playing an increasingly important role in clean energy. Solar cell manufacturers are making great efforts to improve production efficiency and reduce production costs while increasing production capacity. In this way, the detection system in the production process becomes crucial. The original silicon wafer of solar cells has problems such as black cores, black edges, cracks, dislocations, uneven thickness, and impurities during the production process. Because it is very fragile, it is easy to cause defects that cannot be detected by the naked eye during the production process. Therefore, finding unqualified battery silicon wafers as soon as possible and preventing them from flowing into the nex...
Claims
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Login to View More IPC IPC(8): F16M11/04F16M11/08F16M11/06F16M11/18G01N21/64
CPCF16M11/045F16M11/048F16M11/08F16M11/06F16M11/18G01N21/6456F16M2200/022
Inventor 谢宏威李小明周聪李俊杰
Owner 东莞威森智能科技有限公司