Analog circuit fault diagnosis method based on circular model and neural network

Abstract

The invention discloses an analog circuit fault diagnosis method based on a circular model and a neural network. Firstly, fuzzy group analysis is carried out on an analog circuit, and each piece of fuzzy group information is obtained; then circular model parameters of different measuring points of all the elements in the analog circuit under different test frequencies are obtained through circularmodel simulation, and a feature vector is obtained through construction to be used as a training sample for training a constructed neural network; and a circular model parameter of each measuring point at each test frequency is obtained according to degradation data during fault diagnosis, so as to form a test feature vector to be input into a trained neural network for fault diagnosis. Accordingto the method, the fault diagnosis of the analog circuit is realized by combining the circular model parameters with the neural network, so that the fault diagnosis rate of the analog circuit can beeffectively improved.

Description

technical field [0001] The invention belongs to the technical field of analog circuit fault diagnosis, and more specifically relates to an analog circuit fault diagnosis method based on a circle model and a neural network. Background technique [0002] With the rapid development of integrated circuits, in order to improve product performance, reduce chip area and cost, it is necessary to integrate digital and analog components on the same chip. According to data reports, although the analog part only accounts for 5% of the chip area, its fault diagnosis cost accounts for 95% of the total diagnostic cost. Analog circuit fault diagnosis has always been a "bottleneck" problem in the integrated circuit industry. At this stage, some relatively well-developed analog circuit fault diagnosis theories have been applied to practice, such as: fault dictionary method in pre-test analog diagnosis method, component parameter identification method and fault verification method in post-test...

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Problems solved by technology

However, the circle model under the influence of tolerance also has infinitely many specific eigenvalues, and it is difficult to fully store all faults by using the fault dictionary method

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