Linear classification model defect occurrence prediction method
A linear classification and prediction method technology, applied in the field of machine learning, can solve problems such as uneven data quality, large data volume of capacitive equipment, complex data characteristics, etc., and achieve the effect of improving performance
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[0019] The technical solution of the present invention will be further described in detail below in conjunction with the accompanying drawings, but the protection scope of the present invention is not limited to the following description.
[0020] Such as figure 1 As shown, first, data cleaning is performed on missing values, duplicate values, wrong values, and dirty data in wrong format on the basis of the original data. Secondly, the scorecard model method in the financial field is applied to the capacitive data in this paper to improve feature encoding and construct a WOE feature encoding dataset based on the scorecard model. Then the data balance method solves the problem of sample data imbalance. Finally, the linear classification machine learning algorithm is applied to the defect level prediction, and the supervised learning method is used to train the model and optimize the parameters. The optimal defect level prediction model is obtained. Specifically, this method ...
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