System and method for modeling and correcting frequency of quartz crystal oscillator

A technology for crystal oscillators and products, applied in the field of crystal models and systems for generating test products including crystal oscillators, which can solve the problems of slow and expensive processes

Pending Publication Date: 2019-11-05
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Such a process is relatively slow and expensive, with a TCXO roughly twice the cost of an uncompensated crystal oscillator

Method used

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  • System and method for modeling and correcting frequency of quartz crystal oscillator
  • System and method for modeling and correcting frequency of quartz crystal oscillator
  • System and method for modeling and correcting frequency of quartz crystal oscillator

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Embodiment Construction

[0035] Hereinafter, embodiments of the present disclosure are described in detail with reference to the accompanying drawings. It should be noted that although the same elements are shown in different drawings, they will be designated by the same reference numerals. In the following description, only specific details such as detailed configuration and components are provided to help a comprehensive understanding of the embodiments of the present disclosure. Accordingly, it should be apparent to those skilled in the art that various changes and modifications of the embodiments described herein can be made without departing from the scope of the present disclosure. Also, descriptions of well-known functions and constructions are omitted for clarity and conciseness. Terms described below are terms defined in consideration of functions in the present disclosure, and may vary according to a user, user's intention, or custom. Therefore, definitions of terms should be determined ba...

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Abstract

A method and system for generating a crystal model for a test product including a crystal oscillator are herein disclosed. The method includes the steps: measuring a first temperature of the test product and measuring a first frequency error of the crystal oscillator at a first calibration point during a product testing process, measuring a second temperature of the test product and measuring a second frequency error of the crystal oscillator at a second calibration point during the product testing process, estimating two parameters from the first temperature, first frequency error, second temperature, and second frequency error, and determining a 3rd order polynomial for the crystal model based on the two parameters.

Description

[0001] This application claims U.S. Provisional Patent Application assigned serial number 62 / 663,110 filed with the USPTO on April 26, 2018 and assigned serial number filed with the USPTO on October 16, 2018 Priority to US Patent Application 16 / 161,985, which is hereby incorporated by reference in its entirety. technical field [0002] The present disclosure generally relates to a method and system for calibration of a quartz crystal oscillator. Background technique [0003] Communication systems generally require a crystal oscillator with an accurate and stable frequency that is better than an uncorrected quartz crystal. A crystal oscillator is an electronic oscillator circuit that uses the mechanical resonance of a vibrating crystal of piezoelectric material to create an electrical signal with a specific frequency. The most common type of piezoelectric resonator used is a quartz crystal, so an oscillator circuit incorporating a quartz crystal may be referred to as a cryst...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2601G01K13/00H03B5/04H03B5/32G01K7/32H03L1/022H03L1/04G01S19/01
Inventor 丹尼尔·巴比趣李旷敏
Owner SAMSUNG ELECTRONICS CO LTD
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