System and method for modeling and correcting frequency of quartz crystal oscillator

Abstract

A method and system for generating a crystal model for a test product including a crystal oscillator are herein disclosed. The method includes the steps: measuring a first temperature of the test product and measuring a first frequency error of the crystal oscillator at a first calibration point during a product testing process, measuring a second temperature of the test product and measuring a second frequency error of the crystal oscillator at a second calibration point during the product testing process, estimating two parameters from the first temperature, first frequency error, second temperature, and second frequency error, and determining a 3rd order polynomial for the crystal model based on the two parameters.

Description

[0001] This application claims U.S. Provisional Patent Application assigned serial number 62 / 663,110 filed with the USPTO on April 26, 2018 and assigned serial number filed with the USPTO on October 16, 2018 Priority to US Patent Application 16 / 161,985, which is hereby incorporated by reference in its entirety. technical field [0002] The present disclosure generally relates to a method and system for calibration of a quartz crystal oscillator. Background technique [0003] Communication systems generally require a crystal oscillator with an accurate and stable frequency that is better than an uncorrected quartz crystal. A crystal oscillator is an electronic oscillator circuit that uses the mechanical resonance of a vibrating crystal of piezoelectric material to create an electrical signal with a specific frequency. The most common type of piezoelectric resonator used is a quartz crystal, so an oscillator circuit incorporating a quartz crystal may be referred to as a cryst...

AI Technical Summary

Problems solved by technology

Such a process is relatively slow and expensive, with a TCXO roughly twice the cost of an uncompensated crystal oscillator

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