Manual test base with upper slider structure

Abstract

The invention discloses a manual test base with an upper slider structure, comprising a test base and an upper cover, wherein the upper cover is hinged to one side of the test base and can be flippedand pressed with the test base, a floating plate structure is disposed on the test base, a chip slot is formed in the floating plate structure, a slider is arranged in the middle of the upper cover through a chute on a side, a pressure plate is rotatably disposed in the middle of the slider through a pressure plate groove, the pressure plate is opposite to the chip slot when the upper cover is closed, a stop tongue is disposed in the pressure plate groove such that the pressure plate is inclined, and a return spring and an adjusting screw are symmetrically disposed on the upper and lower sidesof the slider. The manual test base has a simple structure; by using a slider structure on the upper cover, the pressure plate and a chip do not slide relative to each other when the pressure plate is rotated to press the chip; and the pressure plate is inclined to ensure that the contact planes of the pressure plate and the chip are nearly parallel, thereby avoiding local extrusion to the chip and ensuring the test reliability.

Description

technical field [0001] The invention relates to the field of test bases, in particular to a manual test base provided with an upper slider structure. Background technique [0002] The optical camera chip (CIS) and its camera module (CMOS) are widely used in industrial, medical and consumer fields. With the requirements of end users for image processing and the development of high-pixel image acquisition and analysis technology, this product has gradually replaced the original glass optical lens in many fields. [0003] The tens of millions of optical chip modules is a major development trend in the CIS and CMOS industries. At present, this kind of chip is mainly used in satellites, high-altitude reconnaissance aircraft and high-pixel smart cameras. With the product's packaging and testing process becoming more and more mature, the trend of application in high-definition cameras, surveillance cameras, mobile phone cameras and computer cameras will be unstoppable. [0004] I...

AI Technical Summary

Problems solved by technology

[0010] However, since the flap is turned over, when the pressure plate and the chip first come into contact, they can only touch a part of the side of the chip, so that the relative sliding between the pressure plate and the chip may cause the chip to shift, affecting the chip and the chip fixed on the upper cover. The position between the upper lens holes directly affects the test results of high-pixel optical chips

[0011] There is also a manual test screw cap socket, the overall structure is separated from top to bottom, and it is relatively inconvenient to take and place; after the screw cap is pressed, it needs to be tightened, which increases the operation steps and reduces the test efficiency, and the screw cap structure is relatively flip structure. More parts and more complicated structure

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