Product defect detection data processing method, device, system and equipment

A technology for product defect detection and data detection, applied in measurement devices, neural learning methods, optical testing flaws/defects, etc., can solve problems such as low identification efficiency, and achieve high detection efficiency, high efficiency, and high flexibility.

Active Publication Date: 2019-12-10
TENCENT TECH (SHENZHEN) CO LTD
View PDF5 Cites 26 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Based on this, it is necessary to provide a product defect detection data processing method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Product defect detection data processing method, device, system and equipment
  • Product defect detection data processing method, device, system and equipment
  • Product defect detection data processing method, device, system and equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0036] The technologies involved in the method for processing product defect detection data in the embodiments of the present application are explained below.

[0037] Artificial Intelligence (AI) is a theory, method, technology and application system that uses digital computers or machines controlled by digital computers to simulate, extend and expand human intelligence, perceive the environment, acquire knowledge and use knowledge to obtain the best results. In other words, artificial intelligence is a comprehensive technique of computer science that attempts to understa...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a product defect detection data processing method, device, system and equipment. The method comprises the steps of receiving a product defect detection model generation request, wherein the product defect detection model generation request carries model training parameters, the model training parameters are determined according to parameter configuration operation of a user, and the model training parameters comprise at least one of defect learning categories or training picture information; obtaining a corresponding training picture according to the model training parameters and obtaining a defect category corresponding to the training picture to obtain a training sample; and carrying out model training according to the training sample to generate a target defectdetection model, the target defect detection model being used for carrying out defect detection on the to-be-detected product according to a to-be-detected picture corresponding to the to-be-detectedproduct to obtain a defect detection result of the to-be-detected product. The model obtained by the method is high in product defect detection efficiency and high in flexibility.

Description

technical field [0001] The present application relates to the field of product inspection, in particular to a data processing method, device, system and equipment for product defect inspection. Background technique [0002] Product quality is one of the most important production indicators in the manufacturing industry. In order to ensure product quality, defect detection of products has become an indispensable process in the production process. For example, in the camera production workshop, it is necessary to sort out the defective cameras produced during the production process, so as to prevent the defective cameras from flowing directly into the next process. [0003] At present, when performing defect detection on products, technical workers are relied on for visual recognition. Manual recognition has factors such as individual differences in understanding of defect detection standards and fatigue, resulting in low defect recognition efficiency. Contents of the invent...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N21/88G01N21/01G06K9/62G06N3/08
CPCG01N21/8851G01N21/01G06N3/08G01N2021/8887G01N2021/0112G06F18/24G06F18/214
Inventor 沈小勇张文杰刘刚
Owner TENCENT TECH (SHENZHEN) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap