Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Cloth defect detection method using hierarchical gradient direction histogram and support vector machine

A support vector machine and gradient direction technology, applied in image enhancement, image analysis, image data processing, etc., can solve the problems of large sample demand, low detection efficiency, high false detection rate and missed detection rate, and improve the quality of cloth Control ability, reduce labor cost, and ensure the effect of accuracy

Pending Publication Date: 2019-12-17
ZHEJIANG NORMAL UNIVERSITY
View PDF2 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is that the false detection rate and missed detection rate of traditional artificial cloth defects are high, it is easy to cause visual fatigue of workers, the detection efficiency is low, and most of the existing cloth image detection methods are easily affected by texture features The demand for samples is large, and the purpose is to provide a cloth defect detection method using layered gradient direction histogram and SVM to solve the above problems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Cloth defect detection method using hierarchical gradient direction histogram and support vector machine
  • Cloth defect detection method using hierarchical gradient direction histogram and support vector machine
  • Cloth defect detection method using hierarchical gradient direction histogram and support vector machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0028] Such as figure 1 As shown, adopt a kind of cloth defect detection method that utilizes layered gradient orientation histogram and support vector machine that the present invention provides, comprise the following steps:

[0029] Taking the twill cloth image of the German TILDA cloth sample library as an example, a kind of cloth defect detection method utilizing a layered gradient direction histogram and a support vector machine provided by the present invention comprises the following steps:

[0030] S1: Obtain a certain type of cloth with defects and non-defective images and perform grayscale processing to form a sample library of grayscale images of defective and non-defective cloths;

[0031] S2: Extract a non-defective cloth gray image from the cloth gray image sample library, and use the autocorrelation coefficient method to calculate the horizontal period Tx and longitudinal period Ty of the texture primitive of the cloth gray image;

[0032] S3: Divide all the c...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a cloth defect detection method using a hierarchical gradient direction histogram and a support vector machine, relates to two aspects of feature extraction and learning classification, and belongs to the field of digital image processing application. The method mainly comprises the steps of image blocking, hierarchical gradient direction histogram feature extraction, support vector machine model training, detection classification and the like. The method comprises the following steps: firstly, partitioning a cloth image, then extracting the hierarchical gradient direction histogram characteristics of each block, then inputting the hierarchical gradient direction histogram characteristics into a trained support vector machine classifier, and judging whether each image block contains defects or not according to the output result of the classifier so as to determine whether the whole cloth image contains defects or not. Results show that the detection method has agood classification effect and certain robustness, and can be applied to actual generation.

Description

technical field [0001] The invention relates to a cloth defect detection method using a layered gradient direction histogram and a support vector machine, belonging to the application field of digital image processing. Background technique [0002] With the rapid development of China's economy, the level of production automation in the textile industry is getting higher and higher, and intelligent textile machines are continuously applied to textile enterprises, which greatly improves the production efficiency of enterprises. At the same time, the textile industry is facing increasingly fierce competition. Only by improving production technology and ensuring product quality can we obtain good returns. The presence or absence of fabric defects is an important manifestation of the quality of fabrics. Traditional defect detection is mainly done by human eyes, but there are many problems in the way of manual visual inspection, such as low recognition rate, low detection efficien...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T7/00G06T7/11G06T7/41G06T5/20G06K9/46G06K9/62
CPCG06T7/0008G06T7/11G06T7/41G06T5/20G06T2207/20032G06T2207/20021G06T2207/30124G06V10/50G06F18/2411
Inventor 赵翠芳陈愉马加成
Owner ZHEJIANG NORMAL UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products