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Three-dimensional scanning method, device and system

A three-dimensional scanning and three-dimensional point technology, applied in the field of devices and systems, and three-dimensional scanning methods, can solve the problem of low quality of two-dimensional texture maps and three-dimensional point cloud images, and achieve the effect of reducing the requirements of control accuracy and improving scanning efficiency.

Inactive Publication Date: 2019-12-24
SHANGHAI BIZHI BIONIC TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a three-dimensional scanning method, device and system to solve the problem that the quality of the two-dimensional texture map and three-dimensional point cloud image of the measured workpiece obtained by the existing three-dimensional scanning method is not high when the measured workpiece is in a moving state technical issues

Method used

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  • Three-dimensional scanning method, device and system
  • Three-dimensional scanning method, device and system

Examples

Experimental program
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Effect test

Embodiment 1

[0067] This embodiment discloses a three-dimensional scanning method, such as figure 1 with figure 2 as shown, figure 1 is a flow chart of the three-dimensional scanning method provided in this embodiment; figure 2 It is a flow chart of the coding pattern formation sequence provided by this embodiment.

[0068] The method comprises the steps of:

[0069] Step S100, sequentially acquiring the moving distance of the measured workpiece relative to the scanning unit, each time when the acquired moving distance is the same as the preset trigger distance, a trigger signal is formed;

[0070] Specifically, when the moving distance of the measured workpiece moving relative to the scanning unit is consistent with the preset trigger distance, a trigger signal is formed, and each time the measured workpiece reaches the trigger signal formation condition, the moving distance is acquired again , and since the workpiece under test moves continuously relative to the scanning unit, the ...

Embodiment 2

[0115] This embodiment discloses a 3D scanning system based on the 3D scanning device in Embodiment 1.

[0116] Please refer to Figure 4-Figure 5 , is a structural diagram of the three-dimensional scanning system provided in this embodiment, the system includes:

[0117] a camera and projector device with a scanning unit 210;

[0118] a computer 310 having a computing unit 220; and

[0119] A motion mechanism 320 with an information collection unit 200;

[0120] Wherein, the computer 310 , the camera, the projector device, and the motion mechanism 320 are connected by communication, and the positions of the camera, the projector device, and the motion mechanism 320 are relatively fixed.

[0121] In this system, the movement of the measured workpiece 300 relative to the scanning unit 210 is realized through the motion mechanism 320, and the moving distance of the measured workpiece 300 relative to the scanning unit 210 is sequentially obtained, and the obtained moving dista...

Embodiment 3

[0134] This embodiment is based on Embodiment 2 above, and discloses a three-dimensional scanning system including two projectors. The system is described below. The three-dimensional scanning system described below can be compared with the three-dimensional scanning system described above. Cross reference.

[0135] Such as Image 6 As shown, the camera and projector device includes a camera 331, a first projector 33a and a second projector 33b, wherein the first projector 33a and the second projector 33b are respectively located on both sides of the camera 331, And keep relatively fixed by the connecting bracket 340;

[0136] The scanning system further includes a controller 350, the controller 350 is used to control the switching states of the camera 331, the first projector 33a and the second projector 33b, wherein the first projector 33a and the second projector 33a The switching states of the two projectors 33b are opposite; when the first projector 33a or the second pr...

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Abstract

The invention relates to the technical field of information acquisition, in particular to a three-dimensional scanning method, a three-dimensional scanning device and a three-dimensional scanning system. The three-dimensional scanning method comprises the following steps of: sequentially acquiring a moving distance of a workpiece to be detected relative to a scanning unit, and forming a trigger signal when the acquired moving distance is the same as a preset trigger distance each time; and sequentially projecting F periods of initial coding patterns, wherein F is greater than or equal to 1, onthe workpiece entering the projection field of view according to the trigger signal, wherein each period of initial coding pattern comprises multiple frames of dynamic coding patterns, and one trigger signal correspondingly projects one frame of dynamic coding pattern. The three-dimensional scanning method, the three-dimensional scanning device and the three-dimensional scanning system can scan the workpiece which moves at low speed, medium speed or high speed relative to the scanning unit to obtain high-quality two-dimensional texture maps and three-dimensional point cloud maps.

Description

technical field [0001] The invention relates to the technical field of information collection, in particular to a three-dimensional scanning method, device and system. Background technique [0002] The three-dimensional scanning technology based on structured light is a high-tech integrating optical, mechanical, electronic and computer technologies. It is mainly used to scan the spatial shape and structure of the workpiece to obtain the spatial shape information of the workpiece surface. Online high-speed scanning often adopts the structure of a single camera with a structured light projector, which is widely used because of its simple structure, low cost, and fast measurement speed. The principle is: use the structured light projector to project the projection pattern onto the surface of the workpiece , use the camera to obtain the projected pattern (modulation pattern) that is deformed due to the gradient change on the surface of the measured workpiece, and use the triangu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00G06T7/38
CPCG01B11/00G06T7/38
Inventor 赵楠楠宋洋
Owner SHANGHAI BIZHI BIONIC TECH CO LTD