Method and device for measuring thickness of material sample

A thickness value, measuring host technology, applied in the field of sensor, mechanical test technology and mechanical measurement

Active Publication Date: 2020-01-07
ZHEJIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

For these large-scale measurements, the existing resis...

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  • Method and device for measuring thickness of material sample
  • Method and device for measuring thickness of material sample
  • Method and device for measuring thickness of material sample

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Embodiment Construction

[0067] Below in conjunction with accompanying drawing this design is described further.

[0068] refer to Figure 1-Figure 7 , this design is a method and device for measuring the thickness of a material sample, including a measuring host ZJ, a standard device 0, a positioning block DK, a test piece SJ, a standard device support BZ, a test piece support SZ and a data acquisition-analysis-processing unit 7 part. The measuring host ZJ is the basic measuring device, and the remaining six parts cooperate with the measuring host to form a measuring system.

[0069] The measuring host ZJ is composed of frame 1, coding screw, limit guide rod 4 and double cantilever beam sensors. The structure of the frame 1 includes a base plate B, a left bearing support plate B fixed on the upper part of the base plate B 1 and right bearing support plate B 2 . The upper part of the bottom plate B is processed with a first positioning groove 31 and a second positioning groove 32, and the left be...

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Abstract

The invention discloses a method and device for measuring the thickness of a material sample. The device mainly comprises a measurement host, a positioning block, an etalon, a tested piece and a dataacquisition analysis-processing unit. The measurement host is composed of a base, a coding lead screw and a double-cantilever beam sensor; the coding lead screw includes a micrometer lead screw and athree-state encoder and the three-state encoder is composed of a fluted disc and four pairs of cantilever beam sensors; and the double-cantilever beam sensor consists of a fixed cantilever beam sensorand a movable cantilever beam sensor. During measurement, the double-cantilever-beam sensor clamps the tested piece and cooperates with the encoding lead screw to transmit a measurement signal to thedata acquisition analysis-processing unit; and the data acquisition analysis-processing unit gives a thickness value of the tested piece.

Description

technical field [0001] This design provides a method and device for measuring the thickness of material samples, which are used for the thickness measurement of material mechanical performance test plate samples, arc-shaped cross-section samples and other samples, as well as the thickness measurement of general mechanical parts. It belongs to sensor and mechanical test technology. and mechanical measurement technology. Background technique [0002] Double cantilever beam thickness measuring instrument [1] It is a resistance strain measuring instrument with a resolution of less than 0.002 mm. It can measure the thickness of material tensile samples and other similar mechanical parts with equal cross-sections. The measurement accuracy is not affected by manual operation factors and is suitable for mating. Data processor. However, the range of this instrument is generally below 2 mm, because the measurement range of the resistance strain sensor is limited by the deformation o...

Claims

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Application Information

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IPC IPC(8): G01B7/06
CPCG01B7/06
Inventor 雷华李振华鲁阳
Owner ZHEJIANG UNIV
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