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Batch measuring system for silicon photoelectric devices

A technology of batch measurement and silicon photoelectricity, which is applied in the direction of single semiconductor device testing, components of electrical measuring instruments, and measuring electricity. The effect of long cycle time and high test efficiency

Inactive Publication Date: 2020-01-17
INST OF MODERN PHYSICS CHINESE ACADEMY OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For the measurement of large quantities of silicon optoelectronic devices, the traditional method uses one-by-one testing. However, this has the problem of low test efficiency, and different test environments also have a great impact on the measurement results of silicon optoelectronic devices.

Method used

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  • Batch measuring system for silicon photoelectric devices
  • Batch measuring system for silicon photoelectric devices
  • Batch measuring system for silicon photoelectric devices

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Embodiment Construction

[0020] The present invention will be described in detail below in conjunction with the accompanying drawings. However, it should be understood that the accompanying drawings are provided only for better understanding of the present invention, and they should not be construed as limiting the present invention. In the description of the present invention, it should be understood that the terms "first", "second" and so on are only used for the purpose of description, and should not be understood as indicating or implying relative importance.

[0021] Such as Figure 1 to Figure 3 As shown, the silicon photoelectric device batch measurement system provided by the present invention includes a pulse driver 1, a blue LED 2, an optical integration device 3, a bundled optical fiber 4, a silicon photoelectric device measurement box 5, a data acquisition system 6, a picoammeter 7 and a power supply 8.

[0022] The pulse driver 1 is connected to the input end of at least one blue LED 2 (...

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PUM

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Abstract

The invention relates to a batch measuring system for silicon photoelectric devices, which is characterized by comprising a pulse driver, LED (Light-Emitting Diode) light sources, optical integrationdevices, bundling optical fibers, silicon photoelectric device measuring boxes, a data acquisition system, a picoammeter and a power supply; wherein the pulse driver is connected with an input end ofat least one LED light source, an output end of the each LED light source is connected with the corresponding silicon photoelectric device measuring box successively through the corresponding opticalintegration device and the corresponding bundling optical fiber, the each silicon photoelectric device measuring box is provided with a plurality of to-be-measured silicon photoelectric devices therein, the bundling optical fiber is used for uniformly distributing an optical pulse emitted by the LED light source to each to-be-measured silicon photoelectric device in the silicon photoelectric device measuring box; an output end of the each to-be-measured silicon photoelectric device is connected with the data acquisition system; the silicon photoelectric device measuring boxes are connected inseries, and the silicon photoelectric device measuring box arranged at one end is connected with the power supply through the picoammeter. The batch measuring system of the invention can be widely applied to the technical field of batch measurement.

Description

technical field [0001] The invention relates to a batch measurement system for silicon photoelectric devices, belonging to the technical field of batch measurement. Background technique [0002] At present, many countries are accelerating a series of space exploration and exploration activities, and earth space has become an important place for human activities. The environmental structure of the Earth's space is very complex, and the environment contains a large number of space radiation particles of different types and energies. The detection of the Earth's space environment can be realized by accurately measuring the flux, energy spectrum characteristics and changing laws of these particles. . [0003] The types of detectors used in space detection are diversified. At present, scintillator detectors have been widely used in space detection. The scintillator detector is composed of scintillator and photodetection devices. In order to realize the detection of various phys...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R31/26G01R1/04G01R1/073
CPCG01R1/0416G01R1/073G01R31/003G01R31/2642
Inventor 方芳余玉洪唐述文孙志宇张永杰陈俊岭苏弘千奕赵红赟杨海波孔洁
Owner INST OF MODERN PHYSICS CHINESE ACADEMY OF SCI
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