Batch measuring system for silicon photoelectric devices
A technology of batch measurement and silicon photoelectricity, which is applied in the direction of single semiconductor device testing, components of electrical measuring instruments, and measuring electricity. The effect of long cycle time and high test efficiency
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[0020] The present invention will be described in detail below in conjunction with the accompanying drawings. However, it should be understood that the accompanying drawings are provided only for better understanding of the present invention, and they should not be construed as limiting the present invention. In the description of the present invention, it should be understood that the terms "first", "second" and so on are only used for the purpose of description, and should not be understood as indicating or implying relative importance.
[0021] Such as Figure 1 to Figure 3 As shown, the silicon photoelectric device batch measurement system provided by the present invention includes a pulse driver 1, a blue LED 2, an optical integration device 3, a bundled optical fiber 4, a silicon photoelectric device measurement box 5, a data acquisition system 6, a picoammeter 7 and a power supply 8.
[0022] The pulse driver 1 is connected to the input end of at least one blue LED 2 (...
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