Structure and method for measuring precision of high-speed comparator based on TDC chip

Abstract

The invention discloses a structure and method for measuring the precision of a high-speed comparator based on a TDC chip. The structure comprises a signal generation module, a control module and a TDC chip module, wherein one input end of the high-speed comparator receives direct-current threshold voltage, the other input end of the high-speed comparator receives a group of periodic signals output by the signal generation module, and the TDC chip module comprises an input unit, a plurality of first measurement channels, a plurality of second measurement channels, a processing unit and an output unit; and the delay error calculation unit is used for calculating delay errors of input and output signals of the high-speed comparator in each period of the internal reference clocks and / or calculating period errors of the high-speed comparator in two adjacent internal reference clock periods, and outputting test results of the delay errors and the period errors of the high-speed comparator.

Description

technical field [0001] The invention relates to the field of semiconductor automatic testing equipment, in particular to a structure and method for measuring the precision of a high-speed comparator. Background technique [0002] A comparator is an electronic component that outputs different voltage results at the output terminal by comparing the magnitude of the current or voltage at the two input terminals. see figure 1 , figure 1 The schematic diagram of the input and output error generation principle of the high-speed comparator shown. As shown in the figure, the main function of the high-speed comparator is to quickly compare the input signals, and then output the comparison result. In the field of ATE (semiconductor automated test equipment), high-speed comparators are often integrated inside the PE chip (Pin Electronics) to capture the signal waveform sent by DUT (Device Under Test) to ATE (semiconductor automated test equipment), which is a signal timing analysis ...

AI Technical Summary

Problems solved by technology

[0024] i. Cannot be automated in batches

[0025] It requires manual operation by the tester, cannot automate the test, and will introduce additional errors due to the different operation methods of the tester;

[0026] ii. High requirements on input signal frequency

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