Imaging central point correction method and device of terahertz spectrograph

Abstract

The invention provides an imaging central point correction method and device of a terahertz spectrograph. The method comprises the steps of acquiring a to-be-corrected image of a sample rack, and acquiring actual-measurement central point position information of the sample rack according to the to-be-corrected image; comparing the actual-measurement central point position information with preset theoretical central point position information so as to calculate deviation data between an actual-measurement point position and a theoretical central point position; and automatically correcting an imaging central point position of the terahertz spectrograph according to the deviation data. By the method, an image central point scanned by the terahertz spectrograph and a central point of the sample rack are maintained consistent, the problems that positioning is not accurate due to shift of the central point and a part of image edge is cut are prevented, an image of a designated image is enabled to be obtained by scanning, the completeness of the image is ensured, moreover, automatic correction also can be achieved, the method is simple to operate, and the maintenance cost and the debugging difficulty of equipment are reduced.

Description

technical field [0001] The present application belongs to the field of optical imaging technology, and in particular relates to a method and device for correcting the imaging center point of a terahertz spectrometer, and also relates to electronic equipment and a storage medium for realizing the method for correcting the imaging center point of the terahertz spectrometer. Background technique [0002] The terahertz spectrometer is to obtain the spectral information of the sample by recording the terahertz time-domain waveform transmitted through the sample or reflected from the sample, and obtain the spectral information of the sample through Fourier transform, so as to achieve the identification of the substance and further obtain the material structure information, physical information and Cheminformatics Purposes. In the imaging scanning process of a terahertz spectrometer, the terahertz signal usually scans different positions of the sample point by point to obtain spati...

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Problems solved by technology

[0003] In view of this, the embodiment of the present application provides a method and device for correcting the imaging center point of a terahertz spectrometer, and also provides electronic equipment and a storage medium for realizing the method for correcting the imaging center point of the terahertz spectrometer, so as to solve the problems in the prior art Due to structural design tolerances or optical path adjustment deviations, the center point of the imaging scan of the terahertz spectrometer is not on the center point of the sample holder, and there are technical defects such as inaccurate positioning of the scanned image or partial image edges being cut off.

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