Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Sealing cover balance filling packaging structure and process for sorted flip chips

A technology of flip-chip and packaging structure, which is applied in the direction of electrical components, electrical solid devices, circuits, etc., and can solve problems such as inability to meet individual requirements

Inactive Publication Date: 2020-02-07
太极半导体(苏州)有限公司
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, when the thickness of the sorting flip chip is less than 500 μm, and the cavity depth of the conventional metal cover is higher than 800 μm, the thermal paste on the normal brush interface cannot completely fill the minimum gap space of about 300 μm or even larger, and achieve efficient heat dissipation; thus only Plastic packaging (EMC) type FCBGA packaging can be used, which cannot meet the individual requirements of customers for the packaging form; especially on the premise that the metal cover shares the mold and the size is unified to ensure that the cost is minimized

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Sealing cover balance filling packaging structure and process for sorted flip chips
  • Sealing cover balance filling packaging structure and process for sorted flip chips
  • Sealing cover balance filling packaging structure and process for sorted flip chips

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0043] The present invention is described below in conjunction with accompanying drawing.

[0044] as attached figure 1 As shown in the present invention, a cover balance filling package structure for sorting flip chips includes a substrate 11, a flip chip 12 and a metal cover 7, the bottom of the substrate 11 is soldered with solder balls 9, and the metal cover 7 The frame of the frame is welded on the substrate 11 through solder 6, and the flip chip 12 is located in the metal cover 7; the front side of the flip chip 12 has a plurality of bumps, and the filling glue 2 is arranged between the flip chip 12 and the substrate 11, Filler 2 fills the gap between the flip chip 12 and the substrate 11, and the gap between the bumps; the left and right sides of the back of the flip chip 12 are provided with silicon pads 4, silicon pads 4 Paste on the back of the flip chip 12 through the lower heat-conducting adhesive layer 3 on its lower side, the upper side of the silicon gasket 4 i...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a sealing cover balance filling packaging structure and process for sorted flip chips. The structure comprises a substrate, a flip chip, silicon gaskets, and a metal cover. Themetal cover is welded on the substrate, and the flip chip is located in the metal cover. Filling glue is arranged between the flip chip and the substrate, and the silicon gaskets are arranged on theleft and right sides of the back surface of the flip chip. The upper sides and the lower sides of the silicon gaskets are bonded with the metal cover and the flip chip through heat conduction adhesivelayers. According to the scheme, the structure in which the upper and lower heat conduction interface adhesive layers and the left and right silicon gaskets are combined is adopted, the minimum heatdissipation contact area is guaranteed, left-right balance and no position offset during pasting of the metal cover are guaranteed, and sealing cover product packaging with excellent heat dissipationis achieved. The heat dissipation coefficient of the heat conduction interface adhesive is 3.4 W / Mk, and the heat dissipation coefficient of the silicon gaskets is 149 W / mK. Rapid transfer of heat from the thin sorted flip chip to the metal cover is realized, personalized pursuit of clients for packaging types is satisfied, and the process also has higher mass production operability.

Description

technical field [0001] The invention relates to a capping balanced filling packaging structure and technology for sorting flip chips, and belongs to the technical field of integrated circuit flip chip packaging. Background technique [0002] When the chip is flip-chip soldered on a substrate or other carrier board, it is generally necessary to embed an underfiller between the bumps of the chip, and the bottom of the metal cover (Lid cover) is strongly connected to the substrate by an adhesive. The substrate or other carrier is supported; the top of the cavity of the metal cover is connected to the back of the chip (non-electrical surface) through the interface heat dissipation material (TIM glue) to realize heat conduction, and then the ball is planted and cut into shape. [0003] However, when the thickness of the sorting flip chip is less than 500 μm, and the cavity depth of the conventional metal cover is higher than 800 μm, the thermal paste on the normal brush interface...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L23/31H01L23/367H01L21/56H01L21/48
CPCH01L21/4882H01L21/56H01L23/3128H01L23/3672H01L2224/16225H01L2224/32225H01L2224/73204H01L2224/73253H01L2924/15311H01L2924/00
Inventor 阳芳芳陆海琴马军张光明
Owner 太极半导体(苏州)有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products