Unlock instant, AI-driven research and patent intelligence for your innovation.

Electron beam irradiation device and equipment

An electron beam irradiation, electron beam technology, applied in the field of irradiation control, can solve the problems of difficult samples, irradiation, poor adjustability of irradiation area, etc.

Inactive Publication Date: 2020-04-21
MATERIAL INST OF CHINA ACADEMY OF ENG PHYSICS
View PDF7 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the embodiment of the present application is to provide an electron beam irradiation device and equipment to solve the problem that current electron irradiation accelerators have poor adjustability of the irradiation area due to the limitation of application scenarios, and it is difficult to realize the designated area of ​​the sample. , The problem of specifying an area for irradiation

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electron beam irradiation device and equipment
  • Electron beam irradiation device and equipment
  • Electron beam irradiation device and equipment

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0028] Such as figure 1 As shown, the application provides an electron beam irradiation device, which includes: an electron beam generating unit 10, an electron beam control unit 20, an irradiation chamber 30, a secondary electron collector 40, a signal processing unit 50, and the electron beam The electron beam output end of the beam generating unit 10 is opposite to the irradiation chamber 30, the electron beam control unit 20 is arranged between the electron beam output end of the electron beam generating unit 10 and the irradiation chamber 30, and the secondary electron collector 40 is arranged In the irradiation chamber 30 , the signal processing unit 50 is electrically connected with the secondary electron collector 40 and the electron beam control unit 20 .

[0029] When the electron beam irradiation device designed above starts to operate, the electron beam generating unit 10 generates electron beams, and the electron beams reach the sample through the electron beam co...

no. 2 example

[0048] The present application also provides an electron beam irradiation equipment, which includes a photoelectric device and the electron beam irradiation device in any optional implementation mode in the first embodiment, and the photoelectric device is arranged in the irradiation chamber. Used to test the electrical and optical properties of irradiated samples.

[0049] Since the implementation manner in this embodiment is basically the same as the process in the first embodiment, details are not repeated here.

[0050] The electron beam irradiation equipment designed above realizes high-precision simulation of low-energy electron beams with different energies and intensities, and realizes high-precision control of electron beam intensity. Through precise control of electron irradiation in the designated area and area of ​​the sample , can be used for accurate simulation of electron beam irradiation and multifunctional testing of optical and electrical properties of irradi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an electron beam irradiation device and equipment. The device comprises: an electron beam generation unit, an electron beam control unit, an irradiation chamber, a secondary electron collector and a signal processing unit, an electron beam output end of the electron beam generation unit is opposite to the irradiation chamber, the electron beam control unit is arranged between the electron beam output end of the electron beam generation unit and the irradiation chamber, the secondary electron collector is arranged in the irradiation chamber, and the signal processing unitis electrically connected with the secondary electron collector and the electron beam control unit.

Description

technical field [0001] The present application relates to the technical field of irradiation control, in particular, to an electron beam irradiation device and equipment. Background technique [0002] At present, the widely used device in the industry is to use electron accelerators to simulate high-energy electron beam sources, and then use electron beams to sterilize items and modify materials. With the development of electron beam imaging and aerospace technology, many electron beam detection equipment such as medical CT and industrial non-destructive testing equipment, aerospace vehicles and other circuits that work in the irradiation environment need to have a certain radiation resistance, so it is necessary to The sample realizes the specified area, and the specified area is subjected to electron beam simulation irradiation with fixed electron beam energy and intensity. [0003] However, the current electron irradiation accelerator has the problem of poor adjustabilit...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G21K5/04
CPCG21K5/04
Inventor 赵一英赵陈林娜
Owner MATERIAL INST OF CHINA ACADEMY OF ENG PHYSICS