Three-dimensional magnetic characteristic measuring device suitable for electrical material stress loading

A technology of stress loading and measuring device, applied in the direction of measuring device, magnetic performance measurement, measuring device casing, etc., can solve the problems of inability to study three-dimensional magnetic characteristic measurement, structure fixing, etc., to avoid eddy current, reduce magnetic flux leakage, and improve excitation capability Effect

Active Publication Date: 2020-05-12
HEBEI UNIV OF TECH
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Problems solved by technology

) designed a device that can measure the two-dimensional magnetic properties of a cube sample under the condition of two-dimensional excitation and uniaxial force. The device consists of two C-shaped yokes and four faces Connected for excitation, the cube sample is stressed in the vertical direction through the force-exerting actuator, and the overall device structure is fixed, so it can only measure the two-dimensional magnetic characteristics under the condition of two-dimensional excitation and single-axis force, and it is impossible to study the stress loading Three-dimensional magnetic property measurement under conditions

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  • Three-dimensional magnetic characteristic measuring device suitable for electrical material stress loading
  • Three-dimensional magnetic characteristic measuring device suitable for electrical material stress loading
  • Three-dimensional magnetic characteristic measuring device suitable for electrical material stress loading

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Embodiment Construction

[0058] Specific examples of the present invention are given below. The specific embodiments are only used to further describe the present invention in detail, and do not limit the protection scope of the claims of the present application.

[0059] The invention provides a three-dimensional magnetic characteristic measuring device suitable for electrical materials under stress loading conditions, including a measuring platform, a control module, and an electromagnetic module for a sample to be tested;

[0060] The composition of described control module is as figure 1 As shown, including signal amplifier 28, NI acquisition card 29, power amplifier 30, water cooling resistance 31, matching capacitor box 32 and computer 33, wherein, signal amplifier 28, NI acquisition card 29, power amplifier 30, water cooling resistance 31, matching capacitor The box 32 is connected in sequence, the computer 33 is connected with the NI acquisition card 29; the matching capacitor box 32 is conn...

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Abstract

The invention relates to a three-dimensional magnetic characteristic measuring device suitable for an electrical material under a stress loading condition. The device comprises a measuring table, a control module and a to-be-measured sample electromagnetic module, the control module comprises a signal amplifier, an NI acquisition card, a power amplifier, a water-cooled resistor, a matching capacitor box and a computer, the signal amplifier, the NI acquisition card, the power amplifier, the water-cooled resistor and the matching capacitor box are connected in sequence, and the computer is connected with the NI acquisition card; the matching capacitor box is connected with an exciting coil of the measuring device; and a B-H composite sensing coil in a sample is connected with the signal amplifier. The device is suitable for a sensing structure for the magnetic characteristic measurement experiment of a cubic sample under the stress loading condition.

Description

technical field [0001] The invention relates to the field of three-dimensional magnetic property measurement, in particular to a three-dimensional magnetic property measurement device suitable for electrical materials under stress loading conditions. Background technique [0002] Magnetic materials are widely used in electrical equipment. The measurement of magnetic properties is the prerequisite for us to understand and apply magnetic materials. Currently, the commonly used [0003] The magnetic property measurement methods include one-dimensional Epstein square circle method, ring sample method and two-dimensional single-chip test method. [0004] However, in the actual engineering of equipment manufacturing and operation, electrical materials will be subjected to various forces, such as the residual internal stress caused by material cutting, stamping, assembly, coil winding and cutting, etc., during the rotation of the motor The centrifugal force and the electromagnetic...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/12G01R33/00G01R1/04
CPCG01R33/12G01R33/0005G01R33/0011G01R1/04
Inventor 李永建张文婷万振宇付裕杨明
Owner HEBEI UNIV OF TECH
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