Wafer detection method and wafer detection equipment

A detection method and wafer technology, applied in the direction of semiconductor/solid-state device testing/measurement, electrical components, circuits, etc., can solve the problems of increasing the test cycle, increasing the difficulty of confirming needle marks, and being cumbersome, achieving reduced cycle times and savings The effect of the wafer inspection process

Pending Publication Date: 2020-05-12
CHANGXIN MEMORY TECH INC
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Problems solved by technology

However, wafer inspection involves multiple test sites and different test steps. It is not only very cumbersome to repeatedly detect needle marks to determine whether the probe position i

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  • Wafer detection method and wafer detection equipment
  • Wafer detection method and wafer detection equipment
  • Wafer detection method and wafer detection equipment

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Embodiment Construction

[0067] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments, however, can be embodied in various forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of the embodiments of the present disclosure.

[0068] The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of the embodiments of the present disclosure. ...

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Abstract

The invention provides a wafer detection method and wafer detection equipment, and belongs to the technical field of wafer detection. The wafer detection method comprises the following steps: providing a wafer and a probe, wherein the wafer is provided with a welding disc; determining an initial position, wherein the probe contacts the welding disc at the initial position; controlling the probe tomove to a plurality of detection positions in a set direction; when the probe is located at each detection position, detecting whether the voltage of the probe is located in a preset range; in each detection position where the voltage of the probe is located in the preset range, selecting the detection position with the maximum deviation relative to the initial position along the set direction asthe limit detection position of the set direction; determining an offset range according to the offset of the limit detection position in the set direction relative to the initial position, wherein the offset is a vector; and controlling the probe to move and detecting the wafer according to the offset range. According to the wafer detection method, the position of the probe can be rapidly and accurately controlled, and the wafer detection period is shortened.

Description

technical field [0001] The present disclosure relates to the technical field of wafer inspection, and in particular, to a wafer inspection method and inspection equipment. Background technique [0002] Wafer testing is an important process in the preparation of integrated circuits. It generally uses the probe integrated on the probe card to contact the pads of each chip (die) on the wafer, and then uses electrical testing equipment to test the chip. performance is checked. [0003] During testing, when the probe is in effective contact with the pad, a needle mark will be left on the pad. Therefore, in the prior art, optical means (such as visual inspection or machine vision) are usually used to detect the needle mark, and then determine the probe offset Is the location appropriate. However, wafer inspection involves multiple test sites and different test steps. Repeated inspection of the needle marks to determine whether the probe position setting is appropriate is not onl...

Claims

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Application Information

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IPC IPC(8): H01L21/66
CPCH01L22/14
Inventor 不公告发明人
Owner CHANGXIN MEMORY TECH INC
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