Electromagnetic ultrasonic critical refraction longitudinal wave excitation device
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HEBEI UNIV OF TECH
- Publication Date
- 2020-05-15
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Abstract
Description
technical field
[0001] The invention belongs to the field of electromagnetic ultrasonic detection, in particular to an electromagnetic ultrasonic critical refraction longitudinal wave excitation device. Background technique
[0002] The residual stress generated by the non-uniform deformation of the material will affect its yield strength and structural stability, so the measurement of the residual stress is of great significance to the material structure and engineering safety. The residual stress of most specimens will vary with the depth of the outer surface. In the literature "Rickert Theo. Residual Stress Measurement by ESPI Hole-Drilling [J]. Procedia Cirp, 2016, 45: 203-206." The specimen is gradually drilled, and the measurement of the residual stress change at different depths is achieved by using the electronic speckle interferometry method, but this method will cause irreversible damage to the tested specimen.
[0003] In recent years, non-destructive testing met...