Structure small failure probability calculation method based on double-layer nested optimization and subset simulation
A technology of failure probability and double-layer nesting, which is applied in the direction of nuclear method, probabilistic CAD, design optimization/simulation, etc., can solve problems such as limiting the scope of use, and achieve the effect of improving accuracy and efficiency and improving efficiency
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0093] See Figure 1-Figure 4 , the present invention is based on a double-layer nested optimization and subset simulation method for calculating the small failure probability of a structure, that is, a method for calculating the small failure probability of a structure based on a double-layer nested optimization support vector machine and subset simulation. The method of the present invention utilizes support The reliability model is established by the vector machine method, the implicit limit state function is fitted, and the double-layer nested optimization of the support vector machine is carried out through the multi-path optimization and the effective set method, and the local search area is expanded. Different paths can improve the accuracy and efficiency of modeling; after obtaining the limit state function, use subset simulation to express the small failure probability as the product of a series of larger conditional failure probabilities by introducing reasonable inte...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com