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Low-scattering broadband dual-polarized probe antenna based on reverse four-ridge structure

A ridge structure and low-scattering technology, applied in antenna coupling, radiating element structure, antenna grounding switch structure connection, etc., can solve problems such as error, high standing wave ratio, narrow bandwidth, etc., and achieve small waveguide aperture size, Reduces the effects of multiple reflections and smooth gain changes

Active Publication Date: 2020-05-19
SHANGHAI HOLLYWELL ELECTRONICS SYST TECH
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  • Application Information

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Problems solved by technology

As a dual-polarization probe, it has high cross-polarization recognition and port isolation, but its aperture size is similar to that of a standard circular waveguide, its bandwidth is too narrow, and the maximum value of the standing wave ratio in the band is too high, which is easy to introduce in the measurement. more errors
Therefore, there is still room for improvement in terms of bandwidth, in-band matching, and aperture size.

Method used

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  • Low-scattering broadband dual-polarized probe antenna based on reverse four-ridge structure
  • Low-scattering broadband dual-polarized probe antenna based on reverse four-ridge structure
  • Low-scattering broadband dual-polarized probe antenna based on reverse four-ridge structure

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Embodiment Construction

[0041] see Figure 1 to Figure 5 , The low-scattering broadband dual-polarized probe antenna based on the reverse four-ridge structure provided by the present application includes a circular opening waveguide 1, an axial corrugation 2, a reverse four-ridge structure 3, a bottom support block 4 and a feeding coaxial line 5.

[0042] The circular opening waveguide 1 has a circular waveguide structure as a whole, the bottom surface of the first end 11 is closed, and the second end 12 has an opening without a bottom surface. The side wall of the circular opening waveguide 1 near the first end 11 is center-symmetrically opened with four through holes 13, and the four feeding coaxial lines 5 respectively pass through the four through holes 13 and the reverse four-ridge structure 3. Four spines make electrical connections. Preferably, the cavity length of the circular opening waveguide 1 is 100 mm, the diameter of the cavity cross section is 11 mm, the side wall thickness is 1 mm, t...

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Abstract

The invention discloses a low-scattering broadband dual-polarized probe antenna based on a reverse four-ridge structure. The low-scattering broadband dual-polarized probe antenna comprises a circularopening waveguide, an axial ripple, the reverse four-ridge structure, a bottom supporting block and a feed coaxial line. A first end of the circular opening waveguide is closed, and the second end isprovided with an opening. The openings are arranged in the two ends of the axial ripple. The reverse four-ridge structure is a cross-shaped structure; an outer side of each ridge plate comprises a curve changing section and an impedance adjusting section; an outer ridge line of the curve change section is a three-order Bessel function; and the outer ridge line of the impedance adjusting section isa straight line. The bottom supporting block is a cross-shaped structure composed of four trapezoidal blocks, and the reverse four-ridge structure is connected with the circular opening waveguide through the bottom supporting block. And the feed coaxial line is electrically connected with the reverse four-ridge structure through a through hole in a side wall of the circular opening waveguide. Inthe invention, a bandwidth of the circular opening waveguide antenna is improved, and the antenna has advantages of a high cross polarization identification degree, a high port isolation degree, a smooth in-band gain change and a low scattering effect.

Description

technical field [0001] The present application relates to a probe antenna in the field of microwave anechoic chamber (microwave anechoic chamber) measurement, in particular to a probe antenna for near-field measurement of an antenna plane. Background technique [0002] Antenna measurement techniques are divided into far field (far field) measurement, near field (near field) measurement and compact antenna test range (compact antenna test range) measurement. Among them, the near-field measurement uses a probe with known characteristics to measure the radiation data of the antenna under test in the near field, and then obtains the far-field radiation characteristics of the antenna under test through near-far field transformation. It has attracted widespread attention because of its small footprint, high testing accuracy, and low cost. [0003] Aperture waveguide antenna (waveguide antenna) is often used as probe antenna because of its wide main lobe of radiation pattern, regu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01Q1/36H01Q1/50H01Q1/52
CPCH01Q1/36H01Q1/50H01Q1/52
Inventor 毛小莲洪涛周建华周恬
Owner SHANGHAI HOLLYWELL ELECTRONICS SYST TECH
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