Multi-range platinum resistor temperature measurement circuit and method

A technology of temperature measurement circuit and platinum resistance, which is applied to thermometers, thermometers, and measuring devices that use electric/magnetic elements that are directly sensitive to heat.

Pending Publication Date: 2020-06-02
CHINA JILIANG UNIV
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Aiming at the problem of low accuracy in small and medium ranges of multi-range platinum resistance temperature measurement, the present invention proposes a multi-range platinum resistance temperature measurement circuit and measurement method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-range platinum resistor temperature measurement circuit and method
  • Multi-range platinum resistor temperature measurement circuit and method
  • Multi-range platinum resistor temperature measurement circuit and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0034] The present invention will be described in detail below in conjunction with the specific embodiments shown in the accompanying drawings, but these embodiments do not limit the present invention, those of ordinary skill in the art make structural, method, or functional changes based on these embodiments All are included in the scope of protection of the present invention.

[0035] Such as figure 1 with figure 2 A multi-range platinum resistance temperature measuring circuit is shown, which includes a constant current source 1, a single-pole double-throw switch 2, a reference circuit, a circuit to be tested, a temperature measuring chip 10 and a microcontroller 11;

[0036] The constant current source 1 provides a constant and the same current signal for the reference circuit and the circuit to be tested through the single-pole double-throw switch 2. The temperature measurement chip 10 has two input terminals and one reference input terminal, and is connected to the mic...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
electrical resistanceaaaaaaaaaa
electrical resistanceaaaaaaaaaa
electrical resistanceaaaaaaaaaa
Login to view more

Abstract

The invention discloses a multi-range platinum resistor temperature measurement circuit and a temperature measurement method. The circuit comprises a constant current source, a single-pole double-throw switch, a reference circuit, a to-be-measured circuit, a temperature measurement chip and a microcontroller, wherein the reference circuit comprises a constant resistor and a variable resistor; theto-be-measured resistor comprises a platinum resistor and a variable resistor the same as the reference circuit, wherein the maximum resistance value of the variable resistor is greater than the resistance value of the platinum resistor at the maximum temperature measurement point by changing the size of the variable resistor, and the minimum resistance value of the variable resistor is greater than the resistance value of the constant resistor; through internal calculation of the temperature measurement chip, input voltage at two ends of the constant resistor and input voltage at two ends ofthe platinum resistor are respectively read, the resistance value of the platinum resistor is calculated by utilizing the same current provided for the constant resistor and the platinum resistor by the constant current, and a temperature value corresponding to the platinum resistor at the moment is further obtained. During the solving of a small-range problem, the temperature measurement method can be used for effectively avoiding the problem that the difference between the platinum resistor and the variable resistor is too large, so the temperature measurement precision is improved.

Description

technical field [0001] The invention relates to the field of temperature measurement, in particular to a multi-range platinum resistance temperature measurement circuit and a temperature measurement method. Background technique [0002] Temperature is one of the basic physical quantities of the International System of Units. Temperature detection is widely used in the fields of industrial automation and scientific research. Thermal resistance temperature measurement is based on the characteristic that the resistance value of metal conductors increases with the increase of temperature. Yes, most thermal resistances are made of pure metal materials. Platinum is the most widely used temperature measuring element at present; due to the stable characteristics of platinum, it will not cause physical or chemical changes due to high and low temperatures, and the measurement range is large, which can be It can reach -250°C to 850°C, with high temperature measurement accuracy and high...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01K7/20
CPCG01K7/20
Inventor 黄艳岩林伟敏
Owner CHINA JILIANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2023 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap