Method and system for testing electromagnetic pulse interference
A technology for electromagnetic pulse and interference testing, applied in electronic circuit testing, digital circuit testing, short-circuit testing, etc., can solve the problems of high testing cost, high cost of Gaussian pulse generator or double-exponential pulse generator, and achieve low testing cost Effect
Active Publication Date: 2021-05-07
XIDIAN UNIV
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Problems solved by technology
[0004] However, when the rise time of the rising edge of the electromagnetic pulse is required to be fast enough, the cost of the Gaussian pulse generator or the double-exponential pulse generator is relatively high; Or set matching power amplifiers and monitoring equipment and other auxiliary equipment between the double-exponential pulse generators, so that the test cost of the existing electromagnetic pulse interference test method is relatively high
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[0040] The present invention will be described in further detail below in conjunction with specific examples, but the embodiments of the present invention are not limited thereto.
[0041] In order to reduce the test cost of the electromagnetic pulse interference test, an embodiment of the present invention provides an electromagnetic pulse interference test method and system. Such as figure 1 As shown, the method may include the following steps:
[0042] S10: Using the transmission line pulse test equipment, input an electromagnetic pulse to the port to be tested of the first digital circuit with the first initial voltage and the first voltage step, and monitor the voltage of the input electromagnetic pulse and the leakage current of the first digital circuit.
[0043]Wherein, the first digital circuit can be a digital chip, and can also be a digital circuit built by utilizing multiple digital chips; the transmission line pulse test equipment is also generally called a TLP (...
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The invention discloses an electromagnetic pulse interference testing method and system; the method includes: using transmission line pulse testing equipment, stepping by the first initial voltage and the first voltage, inputting electromagnetic pulses to the first digital circuit, and monitoring the first digital circuit The leakage current of the circuit; when the first digital circuit has leakage current distortion or abnormal function, record the first voltage of the electromagnetic pulse; step by the second initial voltage and the second voltage, and send to the second digital circuit that is the same as the first digital circuit Input an electromagnetic pulse, and monitor the leakage current of the second digital circuit; record the second voltage of the electromagnetic pulse when the leakage current distortion or abnormal function of the second digital circuit occurs; if the difference between the first voltage and the second voltage is less than a preset threshold, The first voltage is used as the electromagnetic pulse interference threshold; wherein, the second initial voltage is obtained by floating up and down according to the first voltage, and the second voltage step is smaller than the first voltage step. The invention can reduce the test cost of electromagnetic pulse interference test.
Description
technical field [0001] The invention belongs to the technical field of electromagnetic pulse interference testing, and in particular relates to an electromagnetic pulse interference testing method and system. Background technique [0002] With the development of pulse power amplification technology, radar antenna technology and pulse weapon technology, the electromagnetic environment is becoming more and more complex, and digital circuits are more and more susceptible to electromagnetic pulse interference; when electromagnetic pulses are coupled into digital circuits, instantaneous High-amplitude voltage and / or current; when the generated voltage and / or current exceeds the capacity of the circuit, it will cause damage or even damage to the digital circuit. Therefore, it is necessary to conduct electromagnetic pulse interference tests on digital circuits to understand the immunity of digital circuits to electromagnetic pulses. When testing, the rising time of the rising edge...
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IPC IPC(8): G01R31/00G01R31/317G01R31/28G01R31/52
CPCG01R31/002G01R31/2841G01R31/2843G01R31/317G01R31/31713
Inventor 刘彧千柴常春李阳吴涵李福星靳文轩
Owner XIDIAN UNIV