Image-based solar cell defect detection system and method

A solar cell and defect technology, which is applied in the field of image detection and solar cell defect detection, can solve the problems of slow detection speed, defect detection rate and accuracy, single type of detection defect, etc., and achieve the effect of real-time detection

Active Publication Date: 2020-06-12
TONGJI UNIV
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Problems solved by technology

[0003] At present, most of the electroluminescent images of solar cells rely on manual detection. Due to the large uncertainties of people, it is difficult to achieve consistent detection standar

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  • Image-based solar cell defect detection system and method
  • Image-based solar cell defect detection system and method
  • Image-based solar cell defect detection system and method

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Embodiment Construction

[0054] The present invention will be further described in detail below in conjunction with specific embodiments and accompanying drawings.

[0055] The invention proposes an image-based solar cell defect detection system aiming at various defect problems occurring in the solar cell manufacturing process. The system provides a set of devices for detection and a method for detecting defects. The detection method is based on traditional image processing methods to detect defects such as black chips, virtual soldering and fragments, and uses a method based on convolutional neural networks to detect splinter defects. The real-time detection of defects in the solar cell manufacturing process is realized.

[0056] The working process and principle of the entire detection system will be described below with a specific embodiment. figure 1 It is a schematic diagram of the device in the embodiment of the present invention, 1 is a DC power supply that provides a forward bias voltage for...

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Abstract

The invention relates to the technical field of image detection, in particular to the field of solar cell defect detection, particularly relates to an image-based solar cell defect detection system and method, and comprises a device for detecting solar cell defects and a solar cell defect detection method. According to the device provided by the invention, the electroluminescence test image of thesolar cell can be obtained; after image preprocessing and image segmentation, a single solar cell block image is extracted; performing image segmentation on the segmented single solar cell; the defects of black pieces, pseudo soldering and broken pieces are detected and recognized based on a traditional image processing mode, the defects of broken pieces are detected and recognized based on a convolutional neural network mode, the solar cells are classified in real time by the detection device according to detection results, and real-time detection of the defects in the production and manufacturing process of the solar cells is achieved.

Description

technical field [0001] The invention relates to the technical field of image detection, in particular to the field of solar cell defect detection. Background technique [0002] Crystalline silicon solar cells may have various defects in the tedious production process, which seriously affects the photoelectric conversion efficiency and life of solar cells. The defect detection method of solar cells is mainly based on infrared image detection, such as electroluminescence (Electroluminescence, Abbreviated as EL). Apply a certain forward bias voltage to the solar cell, and the electric energy will cause the carriers in the cell to recombine and emit infrared light. The area with defects on the cell will become a strong recombination center for minority carriers, resulting in As the number of carriers decreases, the luminous intensity of infrared light will decrease. Therefore, an infrared camera is used to capture electroluminescent images of solar cells, and image processing o...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06T1/00G06T7/11G06T3/40G07C3/14B07C5/34B07C5/344
CPCG06T7/0004G06T1/0014G06T7/11G06T3/4038G07C3/143B07C5/34B07C5/344G06T2207/10048G06T2207/20081G06T2207/20084Y02E10/50
Inventor 钟政舒少龙周磊
Owner TONGJI UNIV
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