Low-reflection plastic lens barrel, manufacturing method thereof, imaging lens group and camera device
A low-reflection, plastic technology, used in installation, optics, instruments, etc., can solve problems such as poor light absorption effect
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Embodiment 1
[0054] In this embodiment, the anti-reflection film 40 only has the base bonding layer 41 and the microstructure layer 42 , and the base bonding layer 41 and the microstructure layer 42 form a combined layer and are disposed on the plane section 31 and the slope section 32 . In this embodiment, the barrel section 10 , the image end 20 and the object end 30 are made of opaque plastic. In this embodiment, the base bonding layer 41 is SIO, and the film thickness of the base bonding layer 41 is 5nm, the microstructure layer 42 is made of a fullerene material having a nano-hollow sphere microstructure, and the microstructure layer 42 The thickness is 500nm. Such as image 3 As shown, the reflectance of the anti-reflection film 40 to light with a wavelength of 380nm to 780nm is about 0.2%.
Embodiment 2
[0056] The difference from the first embodiment is that the specific structure of the antireflection film 40 is different.
[0057] In this embodiment, the anti-reflection film 40 has a base bonding layer 41, a microstructure layer 42 and a low-refractive film layer 43, and the base bonding layer 41 and the microstructure layer 42 form a combined layer and are arranged on the plane section 31 and the slope section 32 Above, the low-refractive film layer 43 is disposed on the last combined layer. In this embodiment, the base bonding layer 41 is SIO, and the film thickness of the base bonding layer 41 is 5nm, the microstructure layer 42 is made of a fullerene material having a nano-hollow sphere microstructure, and the microstructure layer 42 The thickness is 500nm. Low refractive film layer 43 is SiO 2 , and the thickness of the low-refractive film layer 43 is 90 nm. Such as Figure 5 As shown, the reflection rate of the anti-reflection film 40 to light with a wavelength of...
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Abstract
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