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Silicon wafer hydrophilicity detection device and detection method

A detection device and detection method technology, applied in the direction of measurement devices, instruments, scientific instruments, etc., can solve the problems of poor reproducibility, high production cost, unstable hydrophilicity detection results, etc., and achieve good reproducibility, high consistency, The effect of high detection efficiency

Pending Publication Date: 2020-06-26
DONGFANG HUANSHENG PHOTOVOLTAIC (JIANGSU) CO LTD
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Problems solved by technology

[0007] The invention provides a silicon wafer hydrophilicity detection device and detection method, which is suitable for the detection of various silicon wafer sizes, and solves the technical problems of unstable hydrophilicity detection results, poor reproducibility and high production cost in the prior art

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  • Silicon wafer hydrophilicity detection device and detection method
  • Silicon wafer hydrophilicity detection device and detection method

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Embodiment Construction

[0031] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0032] This embodiment proposes a silicon wafer hydrophilicity detection device, such as figure 1 As shown, it includes a dropper 300, and also includes a support assembly 100 for making the silicon wafer 400 be placed obliquely at a set angle. Several liquid droplets, observing the liquid droplet flow track along the inclined direction of the silicon wafer 400, can judge whether the hydrophilicity test of the silicon wafer 400 is qualified.

[0033] Forming a silicon dioxide layer of 3-5nm on the diffusion surface of the silicon wafer 400 can ensure that the anti-PID of the components made of the corresponding battery sheet is qualified. The solution in the liquid pipe 300 is pure water, and the pure water is easy to obtain in the battery manufacturing workshop. The dropper 300 is on the surface of the side containing silicon dioxide on th...

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Abstract

The invention provides a silicon wafer hydrophilicity detection device and a detection method. The silicon wafer hydrophilicity detection device comprises a dropping pipette and a support assembly used for enabling a silicon wafer to be obliquely placed at a set angle, and the dropping pipette is configured to be at the highest position of the silicon wafer and perform quantitative titration alongthe width direction of the silicon wafer. According to the detection device and the detection method provided by the invention, titration operation can be quickly carried out on the silicon wafer, the detection result can be directly observed, and the detection device and the detection method are convenient, safe, good in reproducibility, high in consistency, simple in structural design, easy tooperate, wide in universality and high in detection efficiency.

Description

technical field [0001] The invention belongs to the technical field of solar-grade silicon wafer performance detection, and in particular relates to a silicon wafer hydrophilicity detection device and detection method. Background technique [0002] The PID (potential-induced degradation) phenomenon of photovoltaic modules has attracted great attention from the entire photovoltaic industry. More and more module manufacturers and related research institutions have conducted extensive research and analysis on the induction mechanism of module PID attenuation. The main external factors that affect the PID attenuation of components are ambient temperature, ambient humidity, and the bias electric field formed by the system voltage between the alloy frame, glass, and internal circuits. During the long-term observation of photovoltaic power plants, it is found that PID is most likely to occur when there is residual morning dew or rain on the surface of the modules and there is sunli...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N13/00
CPCG01N13/00G01N2013/003
Inventor 朱军谈锦彪从海泉苗劲飞马擎天
Owner DONGFANG HUANSHENG PHOTOVOLTAIC (JIANGSU) CO LTD
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