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Laser line key point extraction method based on plane target

An extraction method and a planar target technology, applied in the field of calibration of the online structured light vision system, can solve problems such as large influence of subjective factors and difficulty in meeting industrial high-precision measurement requirements, so as to improve measurement accuracy and meet industrial high-precision measurement requirements. The effect of improving computational efficiency

Pending Publication Date: 2020-07-10
LASER RES INST OF SHANDONG ACAD OF SCI +1
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Problems solved by technology

Human subjective factors are greatly affected, and it is difficult to meet the industrial high-precision measurement requirements

Method used

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  • Laser line key point extraction method based on plane target
  • Laser line key point extraction method based on plane target
  • Laser line key point extraction method based on plane target

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Embodiment Construction

[0032] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.

[0033] Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative efforts belong to the protection scope of the present invention.

[0034] Figure 1-Figure 9 It is a speci...

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Abstract

The invention relates to the technical field of calibration methods of line structured light vision systems, in particular to a laser line key point extraction method based on a plane target. The method is characterized by comprising the following steps: S1, binarization of a target image: converting a gray level image obtained by a CCD black and white camera into a binary image; S2, morphologicalimage processing: respectively carrying out corrosion and opening operation processing on the target binary image, and subtracting the result of the opening operation and the result of the corrosionoperation to remove useless information interference in the target image so as to obtain laser ray key image information; S3, Hough linear transformation: acquiring a laser line two-dimensional equation; S4, extracting of two-dimensional coordinates in the image coordinate system on the target laser line. The method has the advantages that the laser line equation extracted through the method can accurately calculate the image coordinate points on the laser line, and the measurement accuracy of the system is greatly improved.

Description

technical field [0001] The invention relates to the technical field of calibration methods for line-structured light vision systems, in particular to a method for automatically extracting two-dimensional equations of line-structured light on a target plane and calculating image coordinates of key points thereof, so as to improve system calibration accuracy. Background technique [0002] Line structured light measurement is a non-contact active optical three-dimensional detection technology. ) to obtain the image, and use the triangulation principle to calculate the three-dimensional coordinates of the object through the geometric relationship of the system. Because of its simple structure, wide measurement range, high efficiency, and simple operation, it plays an important role in industrial measurement, reverse engineering and other fields. [0003] The calibration of the line structured light plane directly determines the accuracy of the three-dimensional measurement of t...

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Application Information

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IPC IPC(8): G06T7/70G06T7/80G06T5/30
CPCG06T7/70G06T7/80G06T5/30G06T2207/10004G06T2207/20224
Inventor 李文龙成巍戈海龙马新强任远
Owner LASER RES INST OF SHANDONG ACAD OF SCI
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