Self-test platform for testing serial RapidIO network switching module

A network switching module and self-testing technology, which is applied in faulty hardware testing methods, faulty computer hardware detection, error detection/correction, etc., can solve problems such as product factory self-test constraints, and achieve convenient performance testing and timely isolation Problems, the effect of improving the development progress

Active Publication Date: 2020-08-11
CHINESE AERONAUTICAL RADIO ELECTRONICS RES INST
View PDF6 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method has great limitations for RapidIO network switching module design manufacturers, and the factory self-test of the product is restricted by the integration test conditions

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Self-test platform for testing serial RapidIO network switching module
  • Self-test platform for testing serial RapidIO network switching module
  • Self-test platform for testing serial RapidIO network switching module

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0022] A self-test platform for testing the serial RapidIO network switching module shown in this embodiment can test the port connection status of the serial RapidIO network switching module without the need for a system integration joint test environment and other terminal node modules, and exchange transmission Delay, end-to-end transmission bandwidth, port transmission bit error rate and automatic optimization of signal quality. This embodiment can greatly improve the qualified rate of ex-factory products, and also provides a means for other RapidIO terminal node modules in the system to isolate faults and serve the joint test of the whole machine system.

[0023] A self-test platform for testing a serial RapidIO network switch module shown in this embodiment includes baseboard hardware and test software. Backplane hardware such as figu...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a self-test platform for testing a serial RapidIO network switching module, and the platform comprises bottom plate hardware and test software, and the bottom plate hardware comprises a plurality of port pins, two FPGA chips, and two debugging serial ports. The port pins are used for leading each outer outgoing port of the switching module to a bottom plate, and a self-loopback relation is formed between any two port pins by adopting an external self-loopback mode; the debugging serial port is used for outputting a test request to the FPGA chip; one SRIO interface is led out of the two FPGA chips to be connected with any port pin in an external jumper mode according to test requirements, and the same test software resides in the two FPGAs; and the test software comprises a switch driver, a RapidIO controller and a function test unit and is used for completing various test items. Under the condition of not depending on a system testing environment, the platform is suitable for testing functions and performances of various customized serial RapidIO network switching modules.

Description

technical field [0001] The invention belongs to the field of high-speed interconnection of embedded systems, in particular to a self-testing platform for testing the functions and performances of serial RapidIO network switching modules of modern high-performance embedded systems. Background technique [0002] At present, with major changes in I / O interconnection technology and architecture, emerging interconnection technologies are emerging. As an open standard, the RapidIO interconnect architecture meets the extensive application requirements of embedded infrastructure. RapidIO technology mostly adopts a switch-based interconnection topology, and RapidIO endpoint devices are not directly interconnected but interconnected through RapidIO switches. The communication links of multiple RapidIO end devices in the system are organized by RapidIO switches, which can realize arbitrary interconnection and concurrent transmission of the RapidIO system, and double the system bandwid...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/221G06F11/2273Y02D10/00
Inventor 周海兵穆春鑫曲国远朱晓巍
Owner CHINESE AERONAUTICAL RADIO ELECTRONICS RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap