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X-ray test system with high time resolution, high sensitivity and multispectral response

A time-resolved, high-sensitivity technology, used in X-ray energy spectrum distribution measurement, greenhouse gas reduction, climate sustainability, etc. The effect of many measurable spectrum bands, high signal-to-noise ratio and strong electromagnetic compatibility

Active Publication Date: 2022-05-20
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In order to solve the existing XRD-based X-ray time-resolved spectrometer proposed in the background technology, there are problems such as low time resolution, narrow response spectrum range, complex data acquisition system and low electromagnetic compatibility, the present invention provides a high time-resolved , high-sensitivity, multi-spectral response X-ray test system

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  • X-ray test system with high time resolution, high sensitivity and multispectral response

Examples

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Embodiment 1

[0036] Such as figure 1 As shown, a specific implementation structure of an X-ray test system with high time resolution, high sensitivity, and multispectral response, including an optical intensity modulation component 1, a tunable fiber laser 2, a first single-mode fiber 3, and a fiber circulator 4 , a second single-mode optical fiber 5, a third single-mode optical fiber 6, a photodetector 7 and an oscilloscope 8;

[0037] The light intensity modulation assembly 1 includes a sleeve 9, a filter 10 sequentially arranged in the sleeve 9 along the propagation direction of the X-ray to be measured, and a Fabry-Perot cavity interference semiconductor 11; the X-ray radiation source to be measured The radiated light beam is incident on the Fabry-Perot cavity interference semiconductor 11 through the filter 10, so that the Fabry-Perot cavity interference semiconductor 11 produces an instantaneous refractive index change;

[0038] Among them, the material of the Fabry-Perot cavity int...

Embodiment 2

[0043] In order to improve the test efficiency per unit time, the present invention also provides another implementation structure of an X-ray test system with high time resolution, high sensitivity and multi-spectrum response, such as figure 2 As shown, it includes an optical intensity modulation component 1, a tunable fiber laser 2, a first single-mode fiber 3, a fiber splitter 12, 3 laser transmission channels, a fiber bundler 13, a photodetector 7 and an oscilloscope 8; (this N=3 in the examples).

[0044] The number of light intensity modulation assemblies 1 is N; each light intensity modulation assembly 1 includes a sleeve 9, a filter 10 sequentially arranged in the sleeve 9 along the propagation direction of the X-ray to be measured, and a Fabry-Perot Cavity interference type semiconductor 11; the material of the filter 10 in each light intensity modulation component 1 is determined according to different X-ray spectral bands to be measured, such as using a beryllium p...

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Abstract

The invention discloses an X-ray test system with high time resolution, high sensitivity and multi-spectrum response. The system has high time resolution, multiple measurable spectrum segments, strong electromagnetic compatibility, high signal-to-noise ratio and high bandwidth of all optical fibers. Advantages of long-distance transmission. Its specific structure includes a light intensity modulation component, a tunable fiber laser, a first single-mode fiber, a fiber circulator, a second single-mode fiber, a third single-mode fiber, a photodetector and an oscilloscope; the light intensity modulation component includes a sleeve, The filter plate and the Fabry-Perot cavity interferometric semiconductor arranged in the sleeve; the continuous laser light emitted by the tunable fiber laser enters the Fabry-Perot cavity through the first single-mode fiber, the fiber circulator, and the second single-mode fiber. Inside the Porro cavity interference semiconductor; the laser beam after the light intensity adjustment by the Fabry-Perot cavity interference semiconductor is transmitted to the photodetector for photoelectric signal conversion, and the final electrical signal is received by the oscilloscope.

Description

technical field [0001] The invention relates to the technical field of ultrafast diagnosis, in particular to an X-ray test system with high time resolution, high sensitivity and multi-spectrum response, which is used for multi-channel and multi-spectral waveform detection of ultrashort X-rays. Background technique [0002] At present, the multi-channel X-ray time-resolved spectrometer based on electric vacuum X-ray diode (XRD) is still the main detection system for short-pulse X-ray flux intensity in large-scale pulse power devices such as inertial confinement fusion. Restricted by photoelectric signal collection, electron transit time and high-bandwidth electronic signal transmission, the time resolution of XRD can only reach ~100 ps at present, and the detection sensitivity in the hard X-ray energy region is low. In addition, when XRD is used A high-voltage power supply system needs to be configured, and the ultra-fast electrical signal is transmitted to the signal acquisi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01T1/36
CPCG01T1/36Y02E30/10
Inventor 高贵龙何凯闫欣汪韬尹飞田进寿辛丽伟贾祥志吴永程张杰刘冲李少辉刘毅恒
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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