RTL-level circuit reliability measurement method based on random and parallel computing strategy

A measurement method and parallel computing technology, applied in the direction of calculation, calculation model, computer aided design, etc., can solve the problems of reducing the effectiveness and applicability of existing methods, and it is difficult to effectively balance the evaluation accuracy and calculation speed, so as to achieve reliable circuit sexual effect

Pending Publication Date: 2020-08-28
ZHEJIANG UNIV OF TECH
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Problems solved by technology

However, the existing RTL-level circuit reliability evaluation methods mainly have the disadvantage that it is difficult to effec...

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  • RTL-level circuit reliability measurement method based on random and parallel computing strategy

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Embodiment Construction

[0030] The present invention will be further described below in conjunction with the accompanying drawings.

[0031] refer to figure 1 , a RTL-level circuit reliability measurement method based on a random and parallel computing strategy, comprising the following steps:

[0032] Step 1: Netlist analysis and initialization of related quantities, the process is as follows:

[0033] 1.1) Analyze the RTL-level circuit netlist through queue temporary storage technology and extract the original input terminal number npt of the circuit and the output terminal number mot of all modules;

[0034] 1.2) Initialize error tolerance err and basic sequence length ls, set ct={0}, cnt=0, t=1, mx=0 and mn=ls;

[0035] Step 2: Generate the circuit input vector vsq of length ls in parallel, the process is as follows:

[0036] 2.1) Generate the i-th uniform non-Bernoulli sequence pv of length ls in parallel based on the sobol sequence i ;

[0037] 2.2) Based on the parallel strategy from the ...

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Abstract

An RTL-level circuit reliability measurement method based on a random and parallel computing strategy comprises the steps: firstly, analyzing a netlist, initializing related quantities, and making preparation for follow-up computing; then, constructing a generation method of a uniform non-Bernoulli sequence based on the sobol sequence, and constructing a circuit input vector with the length of lsand a module output end-oriented fault injection permission sequence by utilizing a parallel computing strategy based on the sequence generation method; then, based on a random calculation strategy, respectively calculating circuit logic output of each input vector under different conditions in parallel; and finally, realizing adaptive convergence of the algorithm through a maximum-minimum ant colony algorithm. The evaluation precision and the calculation speed are effectively considered.

Description

technical field [0001] The invention relates to the measurement of integrated circuit reliability, in particular to an RTL-level circuit reliability measurement method based on random and parallel computing strategies. Background technique [0002] At present, with the rise and wide application of artificial intelligence technology, peoples attention to its safety has also been mentioned to an unprecedented height. However, with the shrinking of the feature size of integrated circuits, the reduction of power supply voltage and the increase of operating frequency, the reliability of circuits is more and more affected by soft errors. This leads to a decrease in the reliability tolerance of the computing unit and storage unit of the artificial intelligence system, which threatens the data security of the activation layer on the computing unit and the weight coefficient on the storage unit, causing the application of the artificial intelligence system in places with high securit...

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Application Information

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IPC IPC(8): G06F30/327G06F30/27G06F30/3308G06N3/00
CPCG06F30/27G06F30/327G06F30/3308G06N3/006
Inventor 肖杰季奇瓯孙紫文胡海根杨旭华
Owner ZHEJIANG UNIV OF TECH
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